研究目的
Investigating the anisotropic transport of charge carriers in perovskite crystals through crystal facet engineering for optoelectronic applications.
研究成果
The crystal facet engineering method effectively controls the morphology and exposed facets of CH3NH3PbBr3 crystals, leading to significant differences in charge carrier transport properties. Devices based on {001} facets show superior performance, indicating the potential for novel optoelectronic applications.
研究不足
The study is limited to CH3NH3PbBr3 perovskite crystals and may not be directly applicable to other perovskite materials. The stability of perovskite under electron beam irradiation is also a concern.
1:Experimental Design and Method Selection:
The study employs a surfactant-assisted liquid-phase self-assembly technique to synthesize CH3NH3PbBr3 crystals with exposed {001} and {110} facets.
2:Sample Selection and Data Sources:
Methylammonium lead bromide (CH3NH3PbBr3) is chosen as the representative perovskite.
3:List of Experimental Equipment and Materials:
Includes PbBr2, CH3NH2, HBr, oleylamine, DTAB, and various instruments like XRD, SEM, TEM, and FLIM.
4:Experimental Procedures and Operational Workflow:
Synthesis of CH3NH3PbBr3 single plates and rods, characterization using XRD, SEM, TEM, and optical measurements, and fabrication of micro-photodetectors.
5:Data Analysis Methods:
Analysis of steady-state PL and TRPL spectra, FLIM measurements, and in situ TEM studies.
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Rigaku D/MAX 2500 diffractometer
D/MAX 2500
Rigaku
X-ray diffraction (XRD) patterns collection
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Hitachi S-4800 field-emission scanning electron microscope
S-4800
Hitachi
Scanning electron microscopy (SEM)
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JEOL-2100F instrument
2100F
JEOL
Transmission electron microscopy (TEM) measurements
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Hitachi F-7000 instrument
F-7000
Hitachi
Fluorescence spectra measurement
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Shimidazu UV-2600 spectrophotometer
UV-2600
Shimidazu
Optical absorption spectra collection
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Olympus FluoView-500 inverted microscope
FluoView-500
Olympus
PL images and confocal images taking
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BRUKER IR microscope
TENSOR-27
BRUKER
FTIR spectra recording
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Agilent 4156C semiconductor parameter analyzer
4156C
Agilent
Current–voltage (I–V) characteristics analysis
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Thorlabs M530L3
M530L3
Thorlabs
Monochromatic light source for photoresponse testing
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Agilent 33600A Series
33600A Series
Agilent
Waveform generator for light modulation
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