研究目的
Investigating the topological properties of single and double bilayer Bi supported on multibilayer Bi(111) films and the impact of the supporting substrate on the topmost Bi bilayer.
研究成果
The study confirms the presence of topological edge states in single and double bilayer Bi(111) islands, regardless of the underlying Bi film thickness. It also demonstrates the tunability of these edge states through edge modifications, providing insights into the topological nature of Bi(111) thin films and potential applications in topological electronics.
研究不足
The study is limited to Bi(111) thin films grown on NbSe2 substrates, and the impact of other substrates or environmental conditions is not explored. The theoretical models may overestimate the quantum confinement of the substrate.
1:Experimental Design and Method Selection:
Combined scanning tunneling microscopy (STM) and first-principles calculations were used to study the electronic properties of Bi(111) thin films grown on a NbSe2 substrate.
2:Sample Selection and Data Sources:
Bi(111) thin films were grown on NbSe2 substrates, with thicknesses varying from 4 to 9 bilayers.
3:List of Experimental Equipment and Materials:
STM system, NbSe2 single crystal, high purity Bi, standard Knudsen cell.
4:Experimental Procedures and Operational Workflow:
Bi was evaporated onto NbSe2 substrates held at room temperature, followed by postannealing. STM and STS measurements were conducted at
5:5 K. Data Analysis Methods:
Density functional theory (DFT) calculations were performed to understand the topological origin of the observed edge states.
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