研究目的
Investigating the influence of the compositional ratio K/Na on the structure and piezoelectric properties in [(Na1-xKx)0.5Bi0.5]Ti0.985Ta0.015O3 ceramics.
研究成果
The ceramics Ta-NK100x were fabricated by conventional solid-state reaction method, and the effects of Na/K on the crystal structural, dielectric, and ferroelectric properties of ceramics were studied. Giant bipolar strain of 0.458% and d*33 of 747 pm/V was achieved at Ta-NK18 along with the maximum unipolar strain of 0.448%. Moreover, the strain behavior remained stable within 105 switching cycles. Therefore, adjusting the ratio of Na/K in Ta-NK is an effective way to obtain the large strain.
研究不足
The study focuses on the influence of K/Na ratio on the properties of the ceramics, but other factors such as sintering temperature and time, which could also affect the properties, were not varied. The study also does not explore the long-term stability of the ceramics under operational conditions.
1：Experimental Design and Method Selection:
The ceramics were prepared using a conventional solid-state reaction technique. High purity raw materials were dried, weighed, ball milled, calcined, remilled, pressed into pellets, and sintered.
2：Sample Selection and Data Sources:
Samples with x =
3：1, 14, 18, 22, 26 were prepared. List of Experimental Equipment and Materials:
XRD (X’Pert PRO MPD, Philips), SEM (JEOL-6700F), Raman spectrometer (Horiba Jobin–Yvon), ferroelectric analyzer (TF-2000, aix ACCT), impedance analyzer (4294A, Agilent), and impedance analyzer (Solartron, SI 1260).
4：0). Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: The powders were ball milled, calcined, remilled, pressed into pellets, sintered, polished, coated with silver electrodes, and consolidated.
5：Data Analysis Methods:
XRD for phase structure, SEM for microstructure, Raman spectroscopy for Raman spectra, ferroelectric analyzer for polarization hysteresis loops and strain curves, impedance analyzers for dielectric parameters and impedance data.
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