研究目的
Investigating the effect of SiO2 addition to TiO2 on its photocatalytic activity for the degradation of congo red under visible light illumination.
研究成果
The study successfully demonstrated that the addition of SiO2 to TiO2 enhances its photocatalytic activity against congo red under visible light illumination, with the highest efficiency observed for 3 mol % SiO2-TiO2 thin films. This is attributed to the tailored band gap and smaller crystallite size, which increase the surface area and photocatalytic activity.
研究不足
The study focuses on the photocatalytic activity under visible light illumination and does not explore other light sources or the long-term stability of the films.
1：Experimental Design and Method Selection:
Sol-gel technique for synthesizing colloidal solutions of SiO2-TiO2 mixed oxides and dip coating technique for depositing thin films over glass slides.
2：Sample Selection and Data Sources:
Glass slides [25 mm × 75 mm × 2 mm] were used as substrates.
3：List of Experimental Equipment and Materials:
Titanium tetra isopropoxide (TTIP), tetraethyl orthosilicate (TEOS), ethanol, acetic acid, congo red (CR) dye.
4：Experimental Procedures and Operational Workflow:
Preparation of SiO2-TiO2 thin films by mixing TTIP with ethanol, adding acetic acid, and TEOS, followed by magnetic stirring, dip coating on glass slides, and calcination at 400 °C for 3 h.
5：Data Analysis Methods:
X-ray diffraction (XRD), energy dispersive X-ray spectroscopy (EDAX), scanning electron microscopy (SEM), UV-visible spectrophotometry, and photoluminescence spectroscopy for characterization and monitoring the degradation of congo red.
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UV-Vis-NIR spectrometer
Shimadzu 1800
Shimadzu
Recording UV-visible spectra of the prepared thin films
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Photoluminescence spectrometer
Shimadzu RF-5301
Shimadzu
Recording photoluminescence spectra of the prepared thin films
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EDAX
Bruker
Bruker
Elemental analysis of the films
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UV spectrophotometer
Shimadzu 1800
Shimadzu
Monitoring the degradation of congo red
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X-ray diffractometer
XPERT PRO
Studying grain size and crystallinity of the films
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Stylus profilometer
Surfest SJ-301
Measuring the thickness of the films
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Scanning electron microscope
Quanta SEG-200
Studying the surface morphology of the films
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