研究目的
To demonstrate light emitting diodes based on CsPbBr3|Cs4PbBr6 composites, improving both quantum efficiency and emission brightness compared with devices using pure CsPbBr3, and to explore the enhanced radiative recombination from CsPbBr3 crystallites confined in the Cs4PbBr6 host matrix.
研究成果
The research demonstrated that CsPbBr3|Cs4PbBr6 composites can significantly improve the brightness, efficiency, and stability of perovskite-based LEDs. The optimal performance was achieved by balancing the composition ratio and thickness of the composite thin films, highlighting the importance of material microstructure in device performance.
研究不足
The study acknowledges that the efficiency of the LEDs was optimized with composite films containing 45 mol% Cs4PbBr6, but suggests that using a different thin film preparation technique might yield different results even with the same molar percentage of Cs4PbBr6.
1:Experimental Design and Method Selection:
The study involved the preparation of CsPbBr3|Cs4PbBr6 composite thin films using thermal evaporation, with the ratio between CsPbBr3 and Cs4PbBr6 tuned by adjusting the ratio of CsBr and PbBr2 precursors.
2:3|Cs4PbBr6 composite thin films using thermal evaporation, with the ratio between CsPbBr3 and Cs4PbBr6 tuned by adjusting the ratio of CsBr and PbBr2 precursors. Sample Selection and Data Sources:
2. Sample Selection and Data Sources: Composite thin films were prepared on glass substrates, with the composition ratio varied to study its effects on optical and electrical properties.
3:List of Experimental Equipment and Materials:
Equipment included a thermal evaporation system, X-ray diffractometer, UV–vis–NIR spectrometer, integrating sphere spectrometer, atomic force microscopy, and LED device fabrication tools. Materials included CsBr, PbBr2, ITO-coated glass substrates, PEDOT:PSS, TPBi, LiF, and Al.
4:Experimental Procedures and Operational Workflow:
The process involved the thermal evaporation of precursors, annealing, device fabrication with various layers, and characterization of optical and electrical properties.
5:Data Analysis Methods:
Data analysis included measuring photoluminescence quantum yield, electroluminescence brightness, and device efficiency, as well as analyzing conductivity and morphology through AFM.
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Panalytical X’PERT Pro powder X-ray diffractometer
X’PERT Pro
Panalytical
Characterization of composite thin films
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Agilent Cary 5000 UV–vis–NIR spectrometer
Cary 5000
Agilent
Recording absorption spectra
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FLS980 spectrometer
FLS980
Edinburgh Instruments
Measuring PLQY
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HORIBA iHR320 spectrometer
iHR320
HORIBA
Measuring electroluminescence and photoluminescence spectrum
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Bruker Dimension Icon
Dimension Icon
Bruker
Atomic force microscopy measurements
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Keithley 4200 multimeter
4200
Keithley
Measuring electrical and optoelectronic characteristics of the devices
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Thorlabs FDS1010 Si photodiode
FDS1010
Thorlabs
Collecting light emission from the front surface of the device
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