研究目的
To develop a double-layer antireflective (AR) coating with tunable refractive indices, high transmittance at specific wavelengths, high laser-induced damage threshold (LIDT), and excellent vacuum stability for high-power laser systems.
研究成果
The developed double-layer AR coating exhibits excellent broadband antireflective performance, high laser-induced damage threshold, and superior vacuum stability, making it a promising candidate for applications in high-power laser systems. The one-step sol-gel process offers a simple and effective method for tuning the refractive indices and porosity of the coatings.
研究不足
The study focuses on the fabrication and characterization of double-layer AR coatings with specific properties. The scalability of the process and the long-term durability under operational conditions in high-power laser systems were not extensively explored.
1:Experimental Design and Method Selection:
A one-step base-catalyzed sol-gel process was employed to fabricate nanoporous silica coatings using tetraethoxysilane (TEOS) as the precursor and hexamethylisilazane (HMDS) as the modifier. The method is designed to be inexpensive, etchant-free, and without high temperature calcination treatment.
2:Sample Selection and Data Sources:
Fused silica substrates were used for the deposition of coatings. The coatings' properties were characterized using various techniques including UV–vis-NIR spectroscopy, SEM, TEM, FTIR, AFM, and ellipsometry.
3:List of Experimental Equipment and Materials:
TEOS, HMDS, ethanol, PDMS, and concentrated ammonia water were used. Equipment included a dip-coating device, UV–vis-NIR spectrometer, SEM, TEM, FTIR spectrometer, AFM, and spectroscopic ellipsometer.
4:Experimental Procedures and Operational Workflow:
The sols were prepared by mixing TEOS, HMDS, ethanol, and ammonia water, followed by aging. Coatings were deposited on substrates via dip-coating. The double-layer coating was fabricated by sequentially coating the bottom and top layers.
5:Data Analysis Methods:
The refractive indices and thickness of the films were measured using spectroscopic ellipsometry. Transmittance spectra were recorded, and the coatings' stability and LIDT were tested.
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