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[IEEE 2018 19th International Conference on Electronic Packaging Technology (ICEPT) - Shanghai (2018.8.8-2018.8.11)] 2018 19th International Conference on Electronic Packaging Technology (ICEPT) - Effect of Ni thickness on the IMC and reliability of ultrathin ENEPIG

DOI:10.1109/ICEPT.2018.8480796 出版年份:2018 更新时间:2025-09-23 15:19:57
摘要: Electroless Ni(P)/electroless Pd/immersion Au ( ENEPIG ) is a common surface finish featured by good solderability, wide application and reliable mechanical properties. With the miniaturization and high integration of the integrated circuits, high thickness of Ni-P will affect the signal integrity because of the gigantic resistance. This study focused on the effect of the Ni layer thickness on the morphology and evolution of IMC and the reliability of ENEPIG. Commercial SAC305 solders were reflowed on different thicknesses of Ni (0.3um and 3um) to study the Cu/Ni IMC evolution while OSP sample was used as a control sample. Aged experiments were conducted at 150°C to evaluate the long term thermal stabilization and After every aging stage, we conducted high speed shear test to estimate the mechanical strength of the IMCs and analysis of fracture morphology. After aging, scallop-shaped IMCs of (Cu,Ni)6Sn5 was formed and its thickness increased with aging as well. Brittle IMC (Cu,Ni)3Sn first began to appear in ultrathin ENEPIG and the shear strength dropped slightly. After 256 h aging, ultrathin Ni layer had been completely consumed and a large number of (Cu,Ni)3Sn formed while 5um ENEPIG still had a good barrier effect. Even if Ni layer had been consumed, ultrathin ENEPIG still had a certain inhibitory effect on IMC growth compared with OSP, probably because of the formation of NiSnP layer. Further drop tests and temperature cycle tests will be conducted and the failure models together with cause will be also presented combined with previous results of IMC evolution.
作者: Hongfa Pan,Liming Gao,Yibo Wang,Ming Li,Weiguo Luo
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To study the effect of the Ni layer thickness on the morphology and evolution of IMC and the reliability of ENEPIG.

Substrates with different surface finish were used to evaluate the microstructure and evolution of IMC in aging process. As for common ENEPIG, the thicker Ni-P can enhance the diffusion inhibition effect sufficiently and there was o brittle IMC growth even after long time aging. For ultrathin ENEPIG, the Ni-P layer was soon consumed completely but the subsequent formation of Ni-Sn-P layer still had a slightly inhibitory effect on the diffusion of Cu. In general, crystalline Ni3P and Ni-Sn-P layers might retard the rapid growth of Cu3Sn IMCs. With the growth of IMC, the shear strength between solder joints and pads was on a downward trend. Properly increasing the thickness of Ni-P layer could reduce the appearance of brittle fracture and effectively enhance the bonding strength.

The study did not observe obvious Kirkendall voids in the experiments maybe because of the short aging time. Further drop tests and temperature cycle tests will be conducted and the failure models together with cause will be also presented combined with previous results of IMC evolution.

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