研究目的
To investigate the thermal stability and dielectric properties of (1?x)BaTiO3-xBi(Sr2/3Nb1/3)O3 solid solution ceramics for application in X8R multilayer ceramic capacitors (MLCCs).
研究成果
The (1?x)BT-xBSN ceramics exhibit excellent thermal stability and low dielectric loss, making them suitable for X8R MLCC applications. The phase transition from tetragonal to pseudo-cubic occurs at x ≥ 0.04, and oxygen vacancies are identified as the primary charge carriers. The 0.9BT-0.1BSN composition shows optimal performance with high permittivity and stability over a broad temperature range.
研究不足
The study is limited to specific composition ranges (x from 0.02 to 0.1) and sintering conditions. Potential optimizations could include exploring other dopants or varying sintering parameters to further enhance properties.
1:Experimental Design and Method Selection:
The study used a traditional solid-state reaction technique to synthesize (1?x)BaTiO3-xBi(Sr2/3Nb1/3)O3 ceramics with x ranging from 0.02 to 0.1. The rationale was to optimize dielectric properties for high-temperature applications. Methods included X-ray diffraction (XRD), Raman spectroscopy, scanning electron microscopy (SEM), and impedance spectroscopy to analyze phase evolution, microstructure, and dielectric behavior.
2:02 to The rationale was to optimize dielectric properties for high-temperature applications. Methods included X-ray diffraction (XRD), Raman spectroscopy, scanning electron microscopy (SEM), and impedance spectroscopy to analyze phase evolution, microstructure, and dielectric behavior. Sample Selection and Data Sources:
2. Sample Selection and Data Sources: Ceramic samples were prepared with varying compositions (0.02 ≤ x ≤ 0.1) and sintered at temperatures from 1280°C to 1380°C. Data were collected from these synthesized samples.
3:02 ≤ x ≤ 1) and sintered at temperatures from 1280°C to 1380°C. Data were collected from these synthesized samples. List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Equipment included an X-ray diffractometer (Model X’Pert PRO; PANalytical), Raman spectrometer (Thermo Fisher Scientific DXR), scanning electron microscope (Model JSM6380-LV SEM; JEOL), and precision impedance analyzer (Model E4980AL; Hewlett-Packard Co). Materials included raw powders for BaTiO3 and Bi(Sr2/3Nb1/3)O3, silver paste for electrodes.
4:Experimental Procedures and Operational Workflow:
Samples were sintered in air for 2 hours. XRD and Raman measurements were done at room temperature. SEM was used to observe microstructure. Dielectric properties were measured from -120°C to 200°C at frequencies of 100 Hz to 1 MHz, and impedance was measured from 640°C to 740°C. Silver electrodes were applied and heated to 700°C.
5:Data Analysis Methods:
XRD patterns were analyzed using PanAlytical software (X’PertHighscore Plus). Impedance data were fitted to Arrhenius equations to calculate activation energies for relaxation and conduction processes.
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X-ray diffractometer
X’Pert PRO
PANalytical
To measure X-ray diffraction patterns for phase analysis of ceramic samples.
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Raman spectrometer
DXR
Thermo Fisher Scientific
To perform Raman spectroscopy for structural analysis of ceramic samples.
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Scanning electron microscope
JSM6380-LV SEM
JEOL
To observe the microstructure and grain size of ceramic samples.
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Precision impedance analyzer
E4980AL
Hewlett-Packard Co
To measure dielectric properties and impedance of ceramic samples over a range of frequencies and temperatures.
E4980A/E4980AL Precision LCR Meter
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