研究目的
To achieve millimeter-scale growth of single-oriented graphene on an amorphous palladium silicide film using uniformly oriented graphene seeds, addressing the challenge of growing single-oriented materials on disordered substrates.
研究成果
Millimeter-scale single-oriented graphene was successfully grown on an amorphous Pd silicide film using uniformly oriented seeds, with seamless domain boundaries and weak substrate interactions. This approach is scalable and can be applied to other amorphous substrates for growing single-oriented 2D materials, offering enhanced electronic properties.
研究不足
The growth is limited by the experimental setup size (up to 3×4 mm2), and the process may involve defects as indicated by Raman D peaks. The scalability to larger wafer sizes is suggested but not fully demonstrated. The method relies on specific conditions like temperature control and Pd deposition, which might not be universally applicable.
1:Experimental Design and Method Selection:
The study involved growing uniformly oriented graphene seeds epitaxially on a Si-faced 6H-SiC(0001) wafer, depositing Pd to form an amorphous Pd silicide film, and facilitating carbon diffusion to enlarge the seeds into single-oriented graphene. Methods included STM, ARPES, LEED, STEM, and first-principles calculations.
2:Sample Selection and Data Sources:
Si-faced 6H-SiC(0001) wafers were used, etched in H2 gas and treated with Si deposition. Data were collected from experimental measurements and computational models.
3:List of Experimental Equipment and Materials:
Equipment included low-temperature STM (Omicron), ARPES analyzer (SIENTA R3000, Gamma Data), LEED, FIB (JIB-4601F, JEOL), STEM (JEM-ARM 200F, JEOL), Raman microscope (WITEC Alpha300), and FET measurement setup (Keithley SCS-4200). Materials included Pd, Si, H2, Au, PMMA, thermal release tape, and substrates like SiO2/Si.
4:0). Materials included Pd, Si, H2, Au, PMMA, thermal release tape, and substrates like SiO2/Si. Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: Steps involved etching SiC wafers, depositing Si and Pd, heating at various temperatures (e.g., 600-1000°C), performing STM, ARPES, LEED, and STEM imaging, transferring graphene using dry transfer, and measuring Raman spectra and electron mobility.
5:Data Analysis Methods:
Data were analyzed using LEED intensity ratios, ARPES for electronic structure, STM for topography, STEM for cross-sectional imaging, Raman spectroscopy for defect analysis, and first-principles DFT calculations for binding energies.
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Raman microscope
Alpha300
WITEC
Obtaining Raman spectra and maps
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FET measurement system
SCS-4200
Keithley
Measuring electron mobility in fabricated devices
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FIB
JIB-4601F
JEOL
Fabricating cross-sectional TEM samples using lift-out technique
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STEM
JEM-ARM 200F
JEOL
Acquiring scanning transmission electron microscopy images
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STM
Omicron
Omicron
Acquiring topographies of samples
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ARPES analyzer
SIENTA R3000
Gamma Data
Performing angle-resolved photoemission spectroscopy measurements
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PMMA
950 A6
micro chem
Used in graphene transfer process as a spin-coated layer
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Thermal release tape
Used in graphene transfer to attach to PMMA/Au/graphene
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