研究目的
To present and validate a new method for determining the energy gap and type of electron transitions in semiconductor materials, as an alternative to existing methods like Tauc and McLean, addressing their limitations especially for multilayers.
研究成果
The ILD method provides a reliable alternative to Tauc and McLean methods for determining energy gap and transition type, especially for multilayers. It allows simultaneous determination of Eg and m without prior assumptions, with results consistent with literature. The method shows practical advantages in handling complex samples and offers more accurate and unambiguous results.
研究不足
The method requires smoothing of absorption data to achieve continuous functions for derivative calculations. The choice of derivative step and filter can affect the fitting accuracy, though the impact on results is minimal. It may be difficult to fit straight lines without proper filtering or step adjustment in some cases.
1：Experimental Design and Method Selection:
The study involves deriving and applying the inverse logarithmic derivative (ILD) method based on Mott and Davies or Cody equations for spectrophotometric data analysis. It compares this with Tauc and McLean methods.
2：Sample Selection and Data Sources:
Thin films of TiO2 and a MoS2/TiO2 bilayer were produced by RF magnetron sputtering on quartz substrates. Optical measurements were conducted using a spectrophotometer.
3：List of Experimental Equipment and Materials:
RF magnetron sputtering sources, quartz substrates, PerkinElmer UV-Vis Lambda 750 spectrophotometer, Panalytical Empyrean X-ray diffractometer with Co lamp.
4：Experimental Procedures and Operational Workflow:
Samples were sputtered under specific conditions (Ar flow rate: 50 sccm, cathode power: 300 W, pressure about 2.5e-3 Torr). Optical absorbance was measured with a 1 nm step. XRD was used to confirm structure. Data analysis involved applying Tauc, McLean, and ILD methods to the absorption data.
5：5e-3 Torr). Optical absorbance was measured with a 1 nm step. XRD was used to confirm structure. Data analysis involved applying Tauc, McLean, and ILD methods to the absorption data.
Data Analysis Methods:
5. Data Analysis Methods: Numerical derivative calculations, linear fitting, and comparison of results from different methods. Smoothing of data using filters like Fast Fourier Transform was employed to improve analysis.
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