研究目的
To synthesize nanostructured CuI on Si (100) and Cu films/Si(100) substrates using hydrothermal methods, investigate their structural and optical properties, and fabricate a photodetector based on n-ZnO/p-CuI heterojunction to study its photoelectric properties.
研究成果
Nanostructured CuI with γ phase was successfully synthesized on Si and Cu/Si substrates using hydrothermal methods, showing varied morphologies and PL emissions. The p-CuI/n-ZnO heterojunction photodetector exhibited good rectification and a photocurrent to dark current ratio of 80.8 at -3 V, indicating potential for optoelectronic applications. The type-II band alignment facilitates carrier separation, enhancing photoresponse.
研究不足
The growth of high-quality epitaxial CuI films is challenging due to lack of lattice-matched substrates. The methods may lead to oxidation (e.g., CuO formation) and non-uniform nanostructures. Optimization of growth conditions (e.g., time, temperature) could improve quality and device performance.
1:Experimental Design and Method Selection:
Two hydrothermal methods were used: hydrothermal reaction (HR) and hydrothermal evaporation (HE). The rationale was to grow CuI nanostructures on different substrates (Si (100) and Cu films/Si(100)) to study morphology and properties.
2:Sample Selection and Data Sources:
Substrates included Si (100) and Cu films deposited on Si (100) using electron beam evaporation with high-purity Cu pellets. The precursor solution contained CuCl2, PVP, and KI.
3:List of Experimental Equipment and Materials:
Equipment included FEI NanoNova 450 SEM for morphology, Rigaku D/MAX2500V XRD for crystal structure, He-Cd UV laser and monochromator for PL measurements, Keithley 2611A source meter for I-V curves, and Xe lamp for photoresponse. Materials included Cu pellets (
4:999% purity), CuCl2, PVP, KI, and substrates. Experimental Procedures and Operational Workflow:
For HR, substrates were immersed in the precursor solution at 200°C for 3 hours. For HE, substrates were suspended on the solution surface. Cu films were deposited by electron beam evaporation. After growth, samples were characterized using SEM, XRD, PL, and I-V measurements. A photodetector was fabricated with n-ZnO on FTO glass and p-CuI on top.
5:Data Analysis Methods:
XRD patterns were compared to JCPDS standards. PL spectra were analyzed with Gaussian fits. I-V curves were measured to determine rectification and photocurrent ratios. Photoresponse was measured under UV illumination.
独家科研数据包,助您复现前沿成果,加速创新突破
获取完整内容