研究目的
To investigate the chemical degradation processes in solid dielectrics, specifically interfacial tracking and electrical treeing, using the AFM-IR technique for high-resolution analysis.
研究成果
AFM-IR provides unique insights into chemical degradation in solid dielectrics, revealing detailed chemical changes in interfacial tracking and electrical treeing with high resolution. It complements existing techniques and enhances understanding of degradation mechanisms, suggesting potential for improved insulation materials and reliability.
研究不足
The technique requires careful sample preparation to expose degraded regions, which may introduce artifacts. The resolution, while high, is limited to surface analysis and may not capture bulk processes fully. The method is sensitive to surface conditions and may not be applicable to all dielectric materials without optimization.
1：Experimental Design and Method Selection:
The study employs the AFM-IR technique for high-resolution chemical analysis of degraded regions in solid dielectrics, comparing it with other methods like FTIR and Raman spectroscopy.
2：Sample Selection and Data Sources:
Samples include interfacial tracking between epoxy and silicone rubber layers and electrical treeing samples with a needle-plane configuration.
3：List of Experimental Equipment and Materials:
Equipment includes the NanoIR2 AFM-IR system, Omicron MPD600 for partial discharge monitoring, polishing papers, diamond compound paste, and materials like Araldite-LY5052, Aradur-HY5052, silicone rubber, stainless-steel wire, and needles.
4：Experimental Procedures and Operational Workflow:
For tracking samples, interfacial tracks are generated by applying AC voltage, and surfaces are exposed for AFM-IR analysis. For treeing samples, needles are inserted into epoxy, voltage is applied until tree initiation, and the region is exposed by cutting and polishing. AFM-IR scans are performed in contact mode with specific scan rates and co-averages.
5：Data Analysis Methods:
Data is analyzed through spectral sweeps and chemical maps at specific wavelengths, normalized to reference peaks, and compared with ATR-FTIR spectra.
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