1：Experimental Design and Method Selection:

The study employs slow solvent evaporation technique for crystal growth, and uses various spectroscopic and electrical characterization methods including Powder XRD, FT-Raman, photoluminescence, complex impedance spectroscopy, dielectric spectroscopy, and modulus spectroscopy to analyze the effects of doping on ADP crystals.

2：Sample Selection and Data Sources:

Pure and L-phenylalanine doped ADP crystals with different weight percentages (0.4, 0.6, and 0.8 wt%) are grown. Samples are coded as pure, 0.4 PHY, 0.6 PHY, and 0.8 PHY.

3：4, 6, and 8 wt%) are grown. Samples are coded as pure, 4 PHY, 6 PHY, and 8 PHY. List of Experimental Equipment and Materials:

3. List of Experimental Equipment and Materials: PHILIPS X’PERT MPD system for Powder XRD, Bruker RFS 27 spectrometer for FT-Raman, Shimadzu RF-5301 PC spectrofluorophotometer for photoluminescence, HIOKI 3532 LCR HITERSTER meter for complex impedance measurements. Materials include ADP and L-phenylalanine dopant.

4：Experimental Procedures and Operational Workflow:

Crystals are grown at room temperature using slow solvent evaporation. Characterization involves recording spectra and measurements at specified frequency and temperature ranges (e.g., 10 Hz to 10 MHz, 323–373 K). Data analysis uses software like powder-X for XRD and manual calculations for other parameters.

5：Data Analysis Methods:

Analysis includes calculating dielectric parameters, a.c. conductivity, electro-optic coefficient, and fitting models such as Jonscher's power law and CBH model. Statistical techniques involve linear fitting for activation energies and other parameters.