研究目的
To characterize the X-ray emission of plasma in a simple mirror axis symmetric trap as a function of the magnetic field profile, specifically investigating the effects of the Bmin/BECR ratio on X-ray homogeneity and temperature.
研究成果
X-ray emission and spectral temperature are strongly dependent on the magnetic field configuration, particularly the Bmin/BECR ratio. A critical ratio of approximately 0.75 triggers strong X-ray emissions, with axial emissions becoming more significant above this threshold. The findings are consistent with observations in other ECR sources and suggest that overcoming this critical ratio may lead to plasma instabilities, indicating a need for optimized ion source design.
研究不足
The experiments were conducted in low power conditions without a closed ECR surface, which may limit generalizability to higher power or different configurations. The study focuses on specific magnetic field ratios and frequencies, and further measurements are needed to fully characterize instabilities.
1：Experimental Design and Method Selection:
The experiment was designed to characterize plasma X-ray emission using Si-Pin and HpGe detectors in axial and radial directions. Theoretical models include fitting spectral temperature from X-ray spectra.
2：Sample Selection and Data Sources:
Plasma was generated in the Flexible Plasma Trap (FPT) at INFN-LNS, using argon gas at pressures around 8e-5 mbar.
3：List of Experimental Equipment and Materials:
FPT plasma trap, Si-Pin detectors (XR-100CR, AMPTEK), HpGe detector, Rohde & Schwarz microwave generator, TWT amplifier, WRD350 waveguides, lead collimators, CCD camera.
4：Experimental Procedures and Operational Workflow:
Set magnetic field profiles by adjusting coil currents; inject microwaves at 4.13 or 6.83 GHz with 80 W power; measure X-rays with detectors; correct data for efficiencies; fit spectra to calculate spectral temperature.
5：13 or 83 GHz with 80 W power; measure X-rays with detectors; correct data for efficiencies; fit spectra to calculate spectral temperature. Data Analysis Methods:
5. Data Analysis Methods: Corrected raw data for detector efficiencies; fitted straight lines to semilogarithmic plots of X-ray spectra to determine spectral temperature; compared axial and radial measurements.
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