研究目的
To prepare and characterize FeSex/Bi2Se3 bilayer thin films using RF magnetron sputtering, investigating their structural, morphological, and magnetic properties with varying Bi2Se3 thicknesses.
研究成果
FeSex/Bi2Se3 bilayer films were successfully grown with c-axis oriented Bi2Se3 crystallites, exhibiting weak ferromagnetism at low temperatures due to FeSe2, and the Bi2Se3 thickness influences structural and magnetic properties, suggesting potential for topological insulator applications.
研究不足
The study is limited to specific thicknesses and sputtering conditions; film quality may vary with parameters, and further optimization is needed for enhanced crystallinity and magnetic properties.
1：Experimental Design and Method Selection:
RF magnetron sputtering was used to deposit Bi2Se3 and Fe-Se layers sequentially on silicon substrates, followed by post-annealing in Se-rich environments to improve film quality.
2：Sample Selection and Data Sources:
Silicon (100) substrates were used; Bi2Se3 thicknesses were varied (20 nm, 60 nm, 90 nm) by controlling sputtering time (35 s, 125 s, 185 s), and Fe-Se layer thickness was fixed at 60 nm.
3：List of Experimental Equipment and Materials:
RF magnetron sputtering system, Bi2Se3 alloy target (
4：999% purity), FeSe target (99% purity), silicon substrates, high-purity Ar gas, annealing furnace. Experimental Procedures and Operational Workflow:
Deposit Bi2Se3 at 300°C, anneal at 300°C for 2 h; deposit Fe-Se at 500°C for 1 h, anneal at 500°C for 6 h in Se-rich environment.
5：Data Analysis Methods:
XRD for crystal structure analysis, FESEM for surface morphology, PPMS for magnetic property measurements.
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