1：Experimental Design and Method Selection:

The study involved irradiating SiC ceramic samples with an intense pulsed electron beam to investigate changes in elemental and phase compositions and substructure. The methodology included using specific electron-beam parameters (accelerated electron potential 18 keV, energy densities of 10, 15, and 20 J/cm2, pulse length 200 μs, three pulses) to modify the surface layer.

2：Sample Selection and Data Sources:

Ceramic samples were prepared using SiC powder (particle size 0.9–4.0 μm) and nanopowder (particle size 0.06 μm), supplemented with 3 mass% SiC nanopowder (NEOMAT, specific surface area 32 m2/g). Samples were tablets (14 mm diameter, 3 mm thick) produced via SPS sputtering (SPS 155 system, SPSSYNNEX) at T_sp = 2100°C, P_press = 70 MPa, τ_sp = 10 min, then ground and polished.

3：9–0 μm) and nanopowder (particle size 06 μm), supplemented with 3 mass% SiC nanopowder (NEOMAT, specific surface area 32 m2/g). Samples were tablets (14 mm diameter, 3 mm thick) produced via SPS sputtering (SPS 155 system, SPSSYNNEX) at T_sp = 2100°C, P_press = 70 MPa, τ_sp = 10 min, then ground and polished. List of Experimental Equipment and Materials:

3. List of Experimental Equipment and Materials: Equipment included the SOLO system (IHCE SB RAS) for electron-beam treatment, JEOL SEM-7500FA scanning electron microscope, Shimadzu XRD-7000 diffractometer, JEM 2100F transmission electron microscope (JEOL), and Shimadzu DUH-211S dynamic ultramicro hardness tester with Berkovich diamond pyramid.

4：Experimental Procedures and Operational Workflow:

Samples were irradiated with the electron beam under specified parameters. Structure and phase compositions were analyzed before and after treatment using SEM, XRD, and TEM. Physicomechanical characteristics were measured via nanoindentation at P = 10 g load.

5：Data Analysis Methods:

X-ray diffraction for phase composition analysis, electron microscopy for structural and morphological studies, and nanoindentation for hardness and Young's modulus measurements.