1：Experimental Design and Method Selection:

The study involves designing a hybrid nucleation layer composed of a mixed molecular monolayer (MPTMS and APTMS) and an ultra-thin aluminium layer (0.8 nm) deposited via vapour phase methods. The rationale is to enhance film formation and stability by suppressing metal atom diffusion and reducing oxidation. Theoretical models include SAXS for crystallite size analysis and XPS for surface composition.

2：8 nm) deposited via vapour phase methods. The rationale is to enhance film formation and stability by suppressing metal atom diffusion and reducing oxidation. Theoretical models include SAXS for crystallite size analysis and XPS for surface composition. Sample Selection and Data Sources:

2. Sample Selection and Data Sources: Substrates used are glass microscope slides (7525 M, J. Melvin Freed Brand) and PET. Samples are cleaned ultrasonically with Hellmanex III surfactant, deionized water, and propan-2-ol, followed by UV/O3 treatment. Data sources include sheet resistance measurements, UV-vis spectra, AFM, XPS, TEM, and SAXS.

3：List of Experimental Equipment and Materials:

Equipment includes a vacuum evaporator (customized SPECTROS system with N2 glovebox, Kurt J. Lesker), AFM (Asylum Research MFP-3D), UV-vis spectrophotometer (PerkinElmer Lambda 1050), XPS spectrometer (Kratos Axis Ultra DLD), TEM (Jeol 2100 LaB6), and SAXS setup (Xenocs Xeuss 2.0 with Pilatus 300k detector). Materials include MPTMS, APTMS, aluminium, copper, silver, PEI, and various chemicals for cleaning.

4：0 with Pilatus 300k detector). Materials include MPTMS, APTMS, aluminium, copper, silver, PEI, and various chemicals for cleaning. Experimental Procedures and Operational Workflow:

4. Experimental Procedures and Operational Workflow: Substrates are cleaned and treated with UV/O3. Mixed molecular monolayers are deposited in a desiccator at reduced pressure. Al, Cu, or Ag layers are evaporated in vacuum at specified rates. Sheet resistance is measured using a Keithley 2400 source meter with Van der Pauw method. Samples are stored in ambient air for oxidation studies. AFM, XPS, TEM, and SAXS analyses are performed as per standard protocols.

5：Mixed molecular monolayers are deposited in a desiccator at reduced pressure. Al, Cu, or Ag layers are evaporated in vacuum at specified rates. Sheet resistance is measured using a Keithley 2400 source meter with Van der Pauw method. Samples are stored in ambient air for oxidation studies. AFM, XPS, TEM, and SAXS analyses are performed as per standard protocols. Data Analysis Methods:

5. Data Analysis Methods: Data analysis includes fitting SAXS data using Irena package for crystallite size distribution, XPS data analysis with CasaXPS package using Shirley backgrounds and Voigt lineshapes, and statistical analysis of AFM roughness and sheet resistance trends.