研究目的
To develop a sensitive and selective device to monitor the level of Hg2+ ion in the environment, specifically in aquatic environments, using a pyrene-SH functionalized OTFT.
研究成果
The fabricated OTFT sensor with pyrene-SH functionalization demonstrated high selectivity and sensitivity for Hg2+ ion detection, with a detection limit as low as 0.01 μM and capability to detect 25 μM in various water samples. This work contributes to the development of OTFT-based sensors for rapid screening of heavy metal contamination in aquatic environments, though it is limited to single-use due to irreversibility.
研究不足
The sensor exhibits irreversible response to Hg2+ ions, making it suitable only for disposable or single-use applications. The performance decrease after Py-SH addition due to solvent exposure, and the limit of detection calculation showed a higher value (23.89 μM) than the observed sensitivity (0.01 μM), indicating potential optimization needs in measurement and analysis methods.
1:Experimental Design and Method Selection:
The study involved fabricating a bottom-gate top-contact OTFT with a pyrene-SH functionalized layer to detect Hg2+ ions. The design rationale was based on the strong binding affinity of thiol groups to Hg2+ ions. Theoretical models included electrical characterization of OTFT performance and binding mechanisms.
2:Sample Selection and Data Sources:
Metal ion solutions (Hg2+, Ag2+, Cu2+, Mg2+, Mn2+, Ni2+, Zn2+, Pb2+, Ca2+, Co2+) were prepared in deionized water with concentrations from 1 mM to 0.01 μM. Water samples (tap, lake, seawater) were spiked with 25 μM Hg2+ ions for environmental testing.
3:01 μM. Water samples (tap, lake, seawater) were spiked with 25 μM Hg2+ ions for environmental testing. List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Materials included Poly(methyl methacrylate) (PMMA), pentacene, pyrene-SH, chloride salts, dimethyl sulfoxide (DMSO), ethanol. Equipment included Keithley 4200 semiconductor analyzer, Agilent E4980A Precision LCR meter, VEECO Detak surface profilometer, atomic force microscopy (AFM, Bruker dimension icon), FEI Nova 200 scanning electron microscope for EDX, ICP-MS THERMO-ELEMENT XR, Sartorius Basic Meter PB-
4:Experimental Procedures and Operational Workflow:
Device fabrication involved cleaning ITO/glass substrate, spin-coating PMMA dielectric, evaporating pentacene layer, spin-coating Py-SH solution, and depositing gold contacts. Sensor characterization involved dropping 2 μL metal ion solutions on the channel, vacuum-drying, and measuring electrical properties. Environmental testing involved spiking water samples with Hg2+ and measuring responses.
5:Data Analysis Methods:
Data analysis included calculating dielectric constant from capacitance measurements, measuring film thickness and surface morphology, analyzing electrical characteristics (mobility, threshold voltage, on/off ratio), and using linear regression for sensitivity and limit of detection calculations.
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Keithley 4200 semiconductor analyzer
4200
Keithley
Used for electrical characterizations of the device, measuring properties like drain current and threshold voltage.
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Agilent E4980A Precision LCR meter
E4980A
Agilent
Used to measure capacitance for defining the dielectric constant of PMMA dielectric.
E4980A/E4980AL Precision LCR Meter
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VEECO Detak surface profilometer
Detak
VEECO
Used to measure film thicknesses of the device layers.
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Atomic force microscopy
dimension icon
Bruker
Used to observe film surface morphology.
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FEI Nova 200 scanning electron microscope
Nova 200
FEI
Used for energy dispersive X-ray spectroscopy (EDX) to confirm the presence of Hg2+ ions.
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ICP-MS THERMO-ELEMENT XR
XR
THERMO-ELEMENT
Used to confirm the concentration of Hg2+ ions in water samples.
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Sartorius Basic Meter PB-10
PB-10
Sartorius
Used to measure the pH of Hg2+ solutions.
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