研究目的
Investigating the structural, morphological, and optical properties of spray-formed silver-doped zinc sulphide thin films with varying silver concentrations.
研究成果
Silver-doped ZnS thin films exhibit cubic structures with increased crystallite size and reduced defects at higher silver concentrations. Optical properties such as transmittance and energy gap are tunable with doping, making the films suitable for applications in photothermal devices, microelectronics, and anti-reflection coatings for solar cells. The presence of sulfur vacancies and hydrophilic surfaces enhances their utility in electrochemical systems.
研究不足
The study is limited to specific silver concentrations (0-5%) and substrate temperature (400 °C), which may not cover all possible variations. The use of spray pyrolysis might introduce impurities or residues, as indicated by FTIR results. The hydrophilic nature and sulfur vacancies could affect long-term stability in certain applications.
1:Experimental Design and Method Selection:
Chemical spray pyrolysis (CSP) deposition technique was used to synthesize silver-doped and undoped ZnS thin films on soda-lime glass substrates at 400 °C, with varying silver concentrations (0%, 1%, 3%, 5%). The method was chosen for its simplicity, cost-effectiveness, and ease of doping.
2:Sample Selection and Data Sources:
Solutions of ZnCl2, CS(NH2)2, and AgNO3 in double distilled water were prepared with specific molar concentrations to achieve the desired doping levels. Substrates were cleaned prior to deposition.
3:List of Experimental Equipment and Materials:
Equipment included a Bruker D2 phaser table-top model diffractometer for XRD, JEOL JSM-6360 scanning electron microscope for SEM, UV-1800 Shimadzu UV-VIS spectrophotometer for optical analysis, Raman Bruker-MultiRAM spectrometer for Raman spectra, Perkin Elmer Spectrum One spectrometer for FTIR, Flouromax-4 spectrofluorimeter for photoluminescence, XP Stylus Profiler Instrument for thickness measurement, and a contact angle meter for surface energy analysis. Materials included ZnCl2, CS(NH2)2, AgNO3, and soda-lime glass substrates.
4:Experimental Procedures and Operational Workflow:
Solutions were sprayed onto preheated substrates at 400 °C with a nozzle-to-substrate distance of 20 cm. Films were characterized using XRD, SEM, FTIR, UV-VIS, Raman, photoluminescence, and contact angle measurements to analyze structural, morphological, and optical properties.
5:Data Analysis Methods:
Data were analyzed using standard techniques such as Tauc plot for energy gap calculation, formulas for refractive index, extinction coefficient, dielectric constants, and optical conductivity, with comparisons to literature values.
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diffractometer
D2 phaser table-top model
Bruker
Used for x-ray diffraction analysis to identify crystal structures of the thin films.
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scanning electron microscope
JSM-6360
JEOL
Used to examine the surface morphology and presence of nanoparticles and pores in the thin films.
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UV-VIS spectrophotometer
UV-1800
Shimadzu
Used to measure optical absorbance and transmittance of the thin films.
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Raman spectrometer
MultiRAM
Bruker
Used to obtain Raman spectra for chemical analysis of the films.
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FTIR spectrometer
Spectrum One
Perkin Elmer
Used for Fourier transform infrared spectrometry to identify chemical bonds in the films.
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spectrofluorimeter
Flouromax-4
Not specified
Used for photoluminescence studies to detect emission peaks and vacancies.
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stylus profiler
XP Stylus Profiler
Not specified
Used to measure the thickness of the thin films.
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contact angle meter
Not specified
Not specified
Used to measure contact angles and surface free energy of the films.
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