研究目的
Investigating the fabrication of Sb2Se3 thin film solar cells by co-sputtering of Sb2Se3 and Se targets to address the issue of Se vacancies and increased recombination centers in films.
研究成果
Sb2Se3 films prepared by co-sputtering exhibited better crystallinities and a preferred orientation along the [2 2 1] direction, which provides easier carrier transport. Supplemental Se decreased the number of Se vacancies in the films and improved their optical and electrical properties. Solar cells with a structure of FTO/CdS/Sb2Se3/Au achieved an efficiency as high as 3.47%.
研究不足
The study focuses on the fabrication of Sb2Se3 thin film solar cells by co-sputtering of Sb2Se3 and Se targets, but does not explore other methods or materials for improving solar cell efficiency.
1：Experimental Design and Method Selection:
Sb2Se3 films were deposited by RF magnetron co-sputtering with Sb2Se3 and Se targets. The substrate temperature was 350 °C without a subsequent annealing process.
2：Sample Selection and Data Sources:
The Se content was controlled by adjusting the sputtering power of the Se target.
3：List of Experimental Equipment and Materials:
RF magnetron sputtering system, Sb2Se3 and Se targets (
4：99%), FTO substrate, CdS films, gold electrodes. Experimental Procedures and Operational Workflow:
The background pressure of the chamber was
5：0 × 10?6 Torr, and Ar was introduced at a rate of 25 sccm. The sputtering pressure was maintained at 0 × 10?3 Torr. Data Analysis Methods:
The structures and crystallinities of the Sb2Se3 films were detected by X-ray diffraction (XRD), Raman scattering analyses, scanning electron microscopy (SEM), atomic force microscope (AFM), UV–visible spectrophotometer, X-ray photoelectron spectroscopy (XPS), and ultraviolet photoelectron spectroscopy (UPS).
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UV–visible spectrophotometer
Shimadzu UV-2600
Shimadzu
Used to measure optical performance of the films.
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Photoelectron spectrometer
Kratos Axis Ultra DLD
Kratos
Used for X-ray photoelectron spectroscopy (XPS) of the films.
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Keysight Precision LCR meter
Keysight E4980AL
Keysight
Used to measure C-V of the solar cells.
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RF magnetron sputtering system
Used for depositing Sb2Se3 films by co-sputtering of Sb2Se3 and Se targets.
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Sb2Se3 target
Hefei Kejing Materials Technology
Used as a sputtering target for fabricating Sb2Se3 films.
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Se target
Hefei Kejing Materials Technology
Used as a sputtering target for supplementing Se in Sb2Se3 films.
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FTO substrate
Used as the substrate for the solar cells.
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CdS films
Used as a buffer layer in the solar cells.
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Gold electrodes
Used as the electrode in the solar cells.
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X-ray diffraction (XRD)
Smart Apex II Duo
Used to detect the structures and crystallinities of the Sb2Se3 films.
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Micro-Raman spectrometer
Thermo Fisher
Used for Raman scattering analyses of the films.
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Scanning electron microscopy (SEM)
Hitachi
Used to observe the surface morphologies and cross-sections of different films.
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Atomic force microscope (AFM)
Nanman
Used to measure surface roughness of the films.
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VG Scienta R4000 analyzer
VG Scienta R4000
VG Scienta
Used for ultraviolet photoelectron spectroscopy (UPS) of the films.
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I-V tester
Cell tester
Used to measure the efficiency of the solar cells.
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Photovoltaic characterization system
PV Measurements QEXL
PV Measurements
Used to detect the external quantum efficiency (EQE) of the solar cells.
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