研究目的
To enhance the piezoelectric property of PVDF-based nanocomposites by combining few-layer MoS2 with PVDF.
研究成果
The addition of well-dispersed few-layer MoS2 significantly enhances the piezoelectric coefficient (up to 360% improvement) and elongation (up to 300% improvement) of PVDF composites, attributed to high compatibility and β-phase induction. This provides a simple method for improving piezoelectric and mechanical properties in flexible electronic applications.
研究不足
Aggregation of MoS2 nanosheets at high loading ratios (above 1-2 wt.%) limits piezoelectric response, and some interstices in composites may affect mechanical properties.
1:Experimental Design and Method Selection:
The study employs a liquid-exfoliation method to produce few-layer MoS2 nanosheets, which are then incorporated into a PVDF matrix to create nanocomposite films. The rationale is to leverage the piezoelectric properties of MoS2 and the β-phase induction in PVDF for enhanced performance.
2:Sample Selection and Data Sources:
Materials include PVDF powder, MoS2 powder, and NMP solvent. Samples are composite films with varying MoS2 content (0-7 wt.%).
3:List of Experimental Equipment and Materials:
Equipment includes sonicator, centrifuge, hot press, XRD, AFM, TEM, SEM, tensile tester, LCR meter, piezoelectric tester, and UV-Vis spectrometer. Materials are PVDF, MoS2, and NMP.
4:Experimental Procedures and Operational Workflow:
MoS2 is exfoliated in NMP via sonication and centrifugation. PVDF is dissolved in NMP, mixed with MoS2 dispersion, stirred, sonicated, dried, hot-pressed, and cut into disks for characterization.
5:Data Analysis Methods:
Structural analysis via XRD and FTIR, morphological analysis via TEM, AFM, and SEM, dielectric properties via LCR meter, piezoelectric coefficient via d33 tester, and mechanical properties via tensile testing.
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X-ray diffractometer
D8 Advance
Bruker
Carry out X-ray measurements for structural analysis
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Emission electron microscope
Zeiss Ultra Plus
Zeiss optics
Perform SEM measurements for cross-section analysis
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LCR meter
E4980A
Agilent
Measure dielectric properties
E4980A/E4980AL Precision LCR Meter
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Ultraviolet–visible absorption spectroscopy
UV2550
Shimadzu
Reflect the concentration of MoS2 dispersion
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Atomic force microscope
MFP-3D-SA
Hangzhou Granpa Technology Co., Ltd.
Obtain AFM images in noncontact mode for morphological analysis
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Transmission electron microscopy
JEM-1400Plus
Japan Electronics Co., Ltd.
Obtain TEM images for structural analysis
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Tensile tester
E44.104
Uhong Measurement and Control Technology (Shanghai) Co., Ltd.
Test tensile mechanical properties
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Quasi-static d33 tester
ZJ-3A
Institute of acoustics, Chinese Academy of Sciences
Measure piezoelectric coefficient d33
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