1：Experimental Design and Method Selection:

The study uses a one-step solution method with anti-solvent assisted crystallization to prepare perovskite thin films. The rationale is to control nucleation and growth kinetics for high-quality films in ambient air. Methods include spin coating, annealing, and characterization techniques.

2：Sample Selection and Data Sources:

Samples include perovskite thin films prepared with ethylacetate, chlorobenzene, and ethylether as anti-solvents. Selection criteria are based on anti-solvent properties (e.g., humidity resistance, toxicity). Data sources are experimental measurements from fabricated solar cells.

3：List of Experimental Equipment and Materials:

Equipment includes spin coater, muffle furnace, SEM (FEI Nova Nano SEM 230), HRTEM (Tecnai G2 F20), XRD (Rigaku D/max-2500), Raman spectrometer (Labram HR Evolution), fluorescence spectrophotometer (HITACHI F-5000), absorption spectrophotometer (UV-2600), solar simulator (Newport 94023 A), EIS equipment (Solartron 1260 and 1287), and IMVS equipment (Zahner Zennium). Materials include Zn(NO3)2·6H2O, 2-methylimidazole, PVP, methanol, isopropyl alcohol, triton X-100, TiCl4, HCl, Zn powder, PbI2, DMSO, acetonitrile, chlorobenzene, ethylacetate, ethylether, DMF, TiO2 paste, 4-tert-butylpyridine, lithium bis(trifluoromethylsulfonyl)imide, CH3NH3I, Spiro-OMeTAD, and FTO glass.

4：Experimental Procedures and Operational Workflow:

Steps include synthesis of ZIF-8 particles, preparation of porous carbon layer by calcination, deposition of TiO2 layer, preparation of perovskite precursor solution, spin coating with anti-solvent addition (timing varied), annealing, deposition of hole transport layer (Spiro-OMeTAD), and thermal evaporation of Au electrode. Variables controlled include anti-solvent type, dropping time, and ambient humidity.

5：Data Analysis Methods:

Data analysis involves SEM for morphology, XRD for crystallinity, absorption spectra for optical properties, J-V curves for photovoltaic performance, EIS for charge transport resistance, IMVS for electron lifetime, and PL spectra for charge injection. Statistical techniques include averaging efficiency from multiple cells.