研究目的
To investigate the origin of the milky appearance in type IaB diamonds by examining their optical and structural properties through cathodoluminescence (CL), transmission electron microscopy (TEM), and electron backscatter diffraction (EBSD).
研究成果
The milky appearance in type IaB diamonds is attributed to dislocation loops (causing hazy areas), nano-inclusions with negative crystals containing compressed δ-N2 phase (causing cloudy areas), and polycrystalline textures with radiating fibrous crystals (similar to ballas diamond). These features scatter light, leading to milkiness, and provide insights into diamond-forming processes, including deep mantle origins and rapid growth conditions.
研究不足
The study is limited to type IaB diamonds, and the findings may not apply to other diamond types. The exact mechanisms of light scattering by dislocation loops and nano-inclusions are not fully quantified, and the sample size is restricted to available submissions, potentially not covering all variations in milky diamonds.
1:Experimental Design and Method Selection:
The study employed CL, TEM, and EBSD to analyze the structural and optical properties of milky type IaB diamonds. CL was used for imaging luminescence features, TEM for high-resolution structural analysis and identification of dislocations and nano-inclusions, and EBSD for micro-texture and crystallographic orientation analysis.
2:Sample Selection and Data Sources:
Samples were collected from diamonds submitted to GIA's laboratory, including faceted and rough diamonds. Six samples were cut into plates for detailed study. All samples were typical milky type IaB diamonds with hazy or cloudy areas.
3:List of Experimental Equipment and Materials:
Equipment included a Zeiss EVO MA10 SEM with CL system, JEOL JEM-2100F and JEOL 2100F TEM instruments, JEOL JSM-7000F FE-SEM with EBSD detector, and a JOEL JEM-9310FIB FIB system for TEM foil preparation. Materials included diamond samples and cleaning agents (HCl and NaNO3 mixture).
4:Experimental Procedures and Operational Workflow:
Samples were cleaned and prepared as plates. CL imaging was performed using SEM with specific voltage and current settings. TEM foils were prepared via FIB milling and analyzed with TEM for bright-field, dark-field, and high-resolution imaging. EBSD analysis involved sample coating, orientation mapping, and data acquisition with specified parameters.
5:Data Analysis Methods:
Data analysis included FFT for diffraction patterns from HRTEM images, EBSD software (Channel 5.0) for orientation maps and pole figures, and interpretation of CL, TEM, and EBSD results to identify structural features responsible for milkiness.
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Scanning Electron Microscope
EVO MA10
Zeiss
Used for cathodoluminescence (CL) imaging to observe luminescence features in diamond samples.
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Transmission Electron Microscope
JEM-2100F
JEOL
Used for high-resolution structural analysis, including bright-field, dark-field, and high-resolution imaging of dislocations and nano-inclusions in diamond samples.
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Transmission Electron Microscope
2100F
JEOL
Used for TEM analysis at the Center for Functional Nanomaterials, similar to JEM-2100F for structural characterization.
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Field Emission Scanning Electron Microscope
JSM-7000F
JEOL
Used for electron backscatter diffraction (EBSD) analysis to investigate micro-textures and crystallographic orientations in diamond samples.
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Focused Ion Beam System
JEM-9310FIB
JOEL
Used for preparing TEM foils from diamond samples by milling, enabling detailed TEM analysis.
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EBSD Detector
Nordlys
Used with FE-SEM for detecting Kikuchi patterns and acquiring EBSD data for orientation mapping in diamond samples.
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CL System
Integrated with SEM for cathodoluminescence imaging to capture luminescent features in diamonds.
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Software
Channel 5.0
Used for EBSD data acquisition and analysis, including orientation mapping and pole figure generation.
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