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AIP Conference Proceedings [Author(s) INTERNATIONAL CONFERENCE ON INVENTIVE MATERIAL SCIENCE APPLICATIONS: ICIMA-2018 - Tamil Nadu, India (27–28 September 2018)] - The effect of the ZnO thickness layer on the porous silicon properties deposited by chemical vapor deposition
摘要： We report on the properties of porous silicon deposited by Electro-Chemical Etching (ECE) technique with ZnO nanoparticles layer grown on porous silicon (P-type) by Chemical Vapor Deposition (CVD). X-ray diffraction study on the crystallographic structure revealed a beneficial impact of ZnO films on the structural properties of the porous silicon. Moreover, these properties enhanced when the ZnO layer thickness was increased. The morphological properties of ZnO/PSi were investigated based on Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) measurements. The results indicate an upgrading in the structural stability of PSi substrate with crystalline growth of ZnO thin film. It is also observed that the value of the roughness (RMS) increases when ZnO filme on PSi increases. All these results indicate that the interested ZnO shows a good and homogenous layer using (CVD) technique. Finally, it is evident that porous silicon substrate can open the door for improving the crystalline quality in hexagonal lattice of ZnO thin film, and this could be due to sponge-like structure of porous silicon.
关键词： ZnO,porous silicon,SEM,Chemical Vapor Deposition,AFM,Electro-Chemical Etching,XRD
更新于2025-09-10 09:29:36
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[IEEE 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Paris, France (2018.7.8-2018.7.13)] 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Nanodot-Molecule Junctions: Assessing Intermolecular Interactions and Electron Transport at Microwave Frequencies
摘要： Here, we present the properties of molecular junctions fabricated on a large array of sub-10 nm single crystal Au nanodot electrodes, each junction being made of less than one hundred molecules. Thanks to this approach, we discuss some pending issues in molecular electronic : (i) the determination of inter-molecular interactions from the conductance histograms of molecular junctions, (ii) the demonstration of molecular electronic devices for high-frequency operation with a molecular diode working in the microwave regime up to 18 GHz.
关键词： Molecular electronics,interaction energy,scanning microwave microscope,microwave,electron transport,conducting-AFM
更新于2025-09-10 09:29:36
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[IEEE 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Paris, France (2018.7.8-2018.7.13)] 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Metrological Challenge for Scanning Microwave Microscopy
摘要： We have demonstrated a near-field scanning microscopy (NSOM) based on an atomic force microscope (AFM) for characterization of high dielectric constant materials. The NSOM is applied to measure the dielectric constant of high dielectric constant materials by using a near-field microwave microscope. The NSOM is based on a cantilever with a sharp tip that is used to scan the sample surface. The microwave signal is applied to the tip and the reflected signal is detected by a microwave detector. The dielectric constant of the sample is determined by the phase shift of the reflected signal. The NSOM can measure the dielectric constant of materials with high spatial resolution. The NSOM is used to measure the dielectric constant of high dielectric constant materials such as BaTiO3, SrTiO3, and Pb(Zr,Ti)O3. The dielectric constant of these materials is measured with high accuracy and high spatial resolution.
关键词： dielectric constant,high dielectric constant materials,microwave,AFM,NSOM
更新于2025-09-10 09:29:36
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Atomic Force Microscopy in Molecular and Cell Biology || AFM and NSOM/QD Based Direct Molecular Visualization at the Single-Cell Level
摘要： Cell surface molecules such as receptors play an important role to regulate many essential cellular processes, including cell adhesion, tissue development, cellular communication, inflammation, tumor metastasis, and microbial infection. Specially, these events often involve multimolecular interactions occurring on a nanometer scale, and how to image the distribution and organization of cell surface molecules are becoming increasingly required in Cell and Molecular biology Sciences. By combing atomic force microscopy (AFM), near-field scanning microscopy (NSOM) and quantum dots (QD) labeling, a novel AFM and NSOM/QD-based dual-color nanoscale imaging system is constructed to directly visualize the distribution and organization of these molecules on cell-membrane surface. And this will supply a powerful tool for direct molecular visualization at the single-cell level.
关键词： NSOM,nanoscale imaging,AFM,cell surface molecules,QD
更新于2025-09-10 09:29:36
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PHYTOSYNTHESIS OF SILVER NANOPARTICLES USING E. CAMALDULENSIS LEAF EXTRACT AND THEIR CHARACTERIZATION
摘要： Herein, we report a simple green synthesis of silver nanoparticles (Ag NPs) by the reduction of aqueous silver salt solution using leaf broth of Eucalyptus camaldulensis. The profile of synthesized silver nanoparticles was evaluated by using UV-visible spectrophotometer, X-ray diffractometer, atomic force microscope, energy-dispersive X-ray spectroscope and scanning electron microscope. Surface plasmon resonance peak of silver nanoparticles appeared at 425 nm in UV-vis spectra of silver nanoparticles. XRD studies clearly confirmed the crystalline nature of the synthesized nanoparticles. The EDX analysis disclosed the arranged inorganic composition of the synthesized Ag NPs. Atomic force microscopy investigation revealed 3D surface profile of nanoparticles. From the SEM images, the silver nanoparticles were found to be more or less spherical with an average diameter range of 110-250 nanometers.
关键词： E. camaldulensis,SEM,AFM,UV-visible spectrophotometry,XRD,Ag NPs
更新于2025-09-10 09:29:36
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Dislocations behavior in highly mismatched III-Sb growth and their impact on the fabrication of <i>top-down</i> n?+?InAs/p?+?GaSb nanowire tunneling devices
摘要： We study in this work the growth and fabrication of top-down highly doped n + InAs(Si)/p + GaSb(Si) Esaki tunneling diodes on (001) GaAs substrates. A careful investigation on the highly mismatched GaSb/GaAs growth is first conducted by means of Reflection High-Energy Electron Diffraction (RHEED), Atomic Force Microscopy (AFM), and X-Ray Diffraction (XRD) analyses. These results are expected to pave the way to methods for III-Sb buffer layer’s integration with low threading dislocation (TD) densities. A comparison between AFM, XRD, defect revealing by chemical etching and transmission electron microscopy (TEM) is then presented to calculate the precise TD density and its influence on the device structure. In the last part, we report on first operating sub-30 nm III-V vertical NW tunneling devices on (001) commercial GaAs substrates.
关键词： III-Sb growth,AFM,dislocations,TEM,nanowire tunneling devices,XRD,RHEED,GaAs substrates
更新于2025-09-10 09:29:36
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Nanoscale oxygen ion dynamics in SrFeO <sub/>2.5+δ</sub> epitaxial thin films
摘要： A variety of functional properties in transition metal oxides are often underpinned by oxygen vacancies. While the oxygen vacancy concentration and arrangements are well-known to have strong influence on the physical properties of oxides, the oxygen dynamics in oxides—including oxygen ion incorporation and movements during redox reactions—remain elusive. Performing conductive AFM studies of epitaxial thin films of oxygen-deficient SrFeO2.5 treated by air-annealing at various temperatures, we observe oxidation-induced enhancement of local electronic conduction on the higher terraces near the outer step edges at which oxygen ions are preferably incorporated and diffuse into the films. We also show that the local conduction can be reversibly controlled by electric-field-induced redox reactions at room temperature. These results highlight the importance of the nanoscale oxygen dynamics in redox reactions in SrFeO2.5 films.
关键词： SrFeO2.5,transition metal oxides,redox reactions,conductive AFM,oxygen vacancies
更新于2025-09-09 09:28:46
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A CD probe with a tailored cantilever for 3D-AFM measurement
摘要： A critical dimensional (CD) probe, such as a boot shaped probe, is widely used for measuring the sidewall profiles of nanostructures in atomic force microscopy (AFM). However, conventional CD probes usually have high spring constants that restrict their ability to operate in critical dimension scanning modes. Furthermore, the flexure spring constant of the tip is much smaller than the torsion spring constant of the cantilever, which probably makes the sidewall measurement unstable. Here, we proposed a method of tailoring the probe where the cantilever was trimmed to reduce the spring constant. The simulation results, using a finite element method (FEM), illustrated that both the flexure and torsion spring constants decreased nearly ten times. Meanwhile, the torsional resonant frequency decreased to below 1 MHz, which could benefit the torsional oscillation scanning. By using a focused ion beam (FIB), a CD probe with a rectangular cantilever was reprocessed. It was mounted to a home-built three-dimensional AFM system (3D-AFM), and had the flexure and torsion sensitivities precisely calibrated. The ratio of the flexure sensitivity to torsion sensitivity showed good accordance with the simulation results. Additionally, a grating standard sample was measured using the tailored probe under a modified step-in scanning mode, and the error due to torsional deformation of the tip was compensated. The measurement results demonstrated the validity of the tailored CD probe in 3D metrology.
关键词： deformation,3D-AFM,sidewall,tailored cantilever,CD probe
更新于2025-09-09 09:28:46
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[IEEE 2017 IEEE 12th Nanotechnology Materials and Devices Conference (NMDC) - Singapore (2017.10.2-2017.10.4)] 2017 IEEE 12th Nanotechnology Materials and Devices Conference (NMDC) - Measurements of Polyimide/Silicon Nitride nanocomposite interphase
摘要： According to recent studies on electrical insulation systems, the nanocomposite organic/inorganic hybrid materials (NC) assure a distinct improvement of their high-temperature functioning and allow strengthening the dielectric properties of these systems. Recently it was shown that some modifications of the electrical properties such as the permittivity, dielectric breakdown and materials lifetime, were often awarded to the properties of what it is called the interphase. This interphase represents the interaction zone between the nanoparticles and the matrix and plays very often a leading part in the definition of the macroscopic properties. In this paper, Atomic Force Microscopy (AFM) is used to make, at the same time, qualitative and quantitative measurements of these interaction zones. For example, Peak Force Quantitative Nano Mechanical (PF QNM) mode, would allow to highlight the presence of the interphase by measuring mechanical properties (Young’s modulus, deformation and adhesion). As a result, this new and original study on Polyimide/Silicon Nitride (PI/Si3N4) nanocomposite confront experimental results with theoretical models.
关键词： Polyimide,PF-QNM,AFM,Nanocomposite,Si3N4 nanofillers,Interphase,Nanodielectrics
更新于2025-09-09 09:28:46
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Microscopic Observation of Chalking in TiO<sub>2</sub> Particles Doped Photocatalytic Polymer Sheets
摘要： When TiO2 particle doped PVDF sheets are irradiated with UV-light, the sheets become cloudy, because local photocatalytic decomposition of PVDF leads to an increase in the surface roughness on a sub-micrometer scale. This is called “chalking”. Chalking results in decreased photocatalytic activity of the sheet. In this study, we investigated the chalking process of TiO2 doped PVDF sheets using SEM/EDX and AFM. In the first stage of chalking, minute cavities appear everywhere in the PVDF sheet surface. With UV-light irradiation, it is found that the density of minute cavities increases until they are connected laterally and then grow into minute cracks. When the decomposition of the PVDF progresses, TiO2 particle aggregates, which show cracks, are exposed on the surface. These results suggest that tensile stress builds up because of the PVDF decomposition.
关键词： AFM,Chalking,Polymer Sheet,Photocatalysis,Solvent Casting Process
更新于2025-09-09 09:28:46