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Switchable Schottky contacts: Simultaneously enhanced output current and reduced leakage current
摘要： Metal-semiconductor contacts are key components of nanoelectronics and atomic-scale integrated circuits. In these components Schottky diodes provide a low forward voltage and a very fast switching rate but suffer the drawback of a high reverse leakage current. Improvement of the reverse bias characteristics without degrading performance of the diode at positive voltages is deemed physically impossible for conventional silicon-based Schottky diodes. However, in this work we propose that this design challenge can be overcome in the organic-based diodes by utilizing reversible transitions between distinct adsorption states of organic molecules on metal surfaces. Motivated by previous experimental observations of controllable adsorption conformations of anthradithiophene on Cu(111), herein we use density functional theory simulations to demonstrate the distinct Schottky barrier heights of the two adsorption states. The higher Schottky barrier of the reverse bias induced by chemisorbed state results in low leakage current; while the lower barrier of the forward bias induced by physisorbed state yields a larger output current. The rectifying behaviors are further supported by nonequilibrium Green's function transport calculations.
关键词： van der Waals forces,Schottky contacts,Schottky barrier height,reverse leakage current,bistable state
更新于2025-09-23 15:23:52
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Reverse bias-dependence of schottky barrier height on silicon carbide: influence of the temperature and donor concentration
摘要： The work deals with the dependences of the Schottky barrier height (SBH) on the reverse bias voltage, temperature and on donor concentration of metal/4H-SiC Schottky diodes. Using the tunneling modeling we have shown that the Schottky barrier height on silicon carbide strongly depends on the reverse bias voltage, temperature and doping concentration. At room temperature, the Schottky barrier height increases with increasing the reverse bias voltage at high doping concentration (about 1016 cm-3), while, at low doping concentration (about 1015 cm-3) the Schottky barrier height decreases with increasing the reverse bias voltage. These behaviors are independent of the Schottky barrier lowering effect. That means other effects occur at the barrier and depend on the reverse applied bias. The barrier height increases with increasing temperature and doping concentration under reverse bias conditions. The barrier heights extracted from the Padovani-Stratton formulas are close to the barrier heights extracted from the Tsu-Esaki formula in particular for the thermionic-field emission.
关键词： Reverse Bias,Silicon Carbide,Extraction,Tunneling,Schottky Barrier Height
更新于2025-09-23 15:22:29
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PdEr-Silicide Formation and Contact Resistivity Reduction to n-Si(100) Realized by Dopant Segregation Process
摘要： In this paper, we have investigated the PdEr-silicide formation utilizing a developed PdEr-alloy target for sputtering, and evaluated the contact resistivity of PdEr-silicide layer formed on n-Si(100) by dopant segregation process for the first time. Pd2Si and ErSi2 have same hexagonal structure, while the Schottky barrier height for electron (Φbn) is different as 0.75 eV and 0.28 eV, respectively. A 20 nm-thick PdEr-alloy layer was deposited on the n-Si(100) substrates utilizing a developed PdEr-alloy target by the RF magnetron sputtering at room temperature. Then, 10 nm-thick TiN encapsulating layer was in-situ deposited at room temperature. Next, silicidation was carried out by the RTA at 500°C for 5 min in N2/4.9%H2 followed by the selective etching. From the J-V characteristics of fabricated Schottky diode, qΦbn was reduced from 0.75 eV of Pd2Si to 0.43 eV of PdEr-silicide. Furthermore, 4.0x10?8Ωcm2 was extracted for the PdEr-silicide to n-Si(100) by the dopant segregation process.
关键词： contact resistivity,PdEr-alloy target,RF magnetron sputtering,schottky barrier height,silicide
更新于2025-09-23 15:22:29
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The influence of electrode for electroluminescence devices based on all-inorganic halide perovskite CsPbBr<sub>3</sub>
摘要： Electroluminescence devices based all-inorganic halide perovskite material with the excellent luminescence performance have been studied extensively in recent years. However, the important role for the electrodes of electroluminescence devices is payed few attention by theoretical and experimental studies. Appropriate electrodes can reduce the Schottky barrier height to decrease the energy loss, and prevent the metal impurities from diffusing into the perovskite material to generate deep traps levels, which improves the luminous efficiency and lifetime of devices. In this paper, not only the interface effects between CsPbBr3 and common metal electrode (Ag, Au, Ni, Cu and Pt) are studied by first-principle calculations, but also the diffusion effects of metal electrode atom into the CsPbBr3 layer are also explored by nudged elastic band calculations. The calculated results show the metal Ag is more suitable for the cathode for CsPbBr3 electroluminescence devices, while the metal Pt is more applicable for the anode. Based on the overall consideration about the interface effects and diffusion effects of the CsPbBr3-metal electrode junctions, the essential principle provide a valuable reference how to select the suitable electrodes for other electroluminescence devices.
关键词： electroluminescence devices,diffusion effects,Schottky barrier height,CsPbBr3,all-inorganic halide perovskite,metal electrodes
更新于2025-09-23 15:19:57
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[IEEE TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON) - Kochi, India (2019.10.17-2019.10.20)] TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON) - An Alternative Approach to Voltage Dependent Reduction of Schottky Barrier Height Modeling in Two Dimensional MSM Photodetectors
摘要： Current-voltage (I-V) characteristics of a two dimensional MSM photodetector can be explained by modified thermionic emission diffusion (TED) theory. The theory assumes that Schottky barrier height (SBH) decreases linearly with bias voltage and hence voltage dependent reduction of SBH is understood in term of a series resistance (Rs) and ideality factor (n). Characterization of Rs and n can be done from dV d(lnI) vs I plot. However, in this paper we are presenting an alternative approach to understanding characteristics of voltage dependent reduction of SBH. We are proposing an exponential relationship between reduction of SBH and bias voltage to understand non ideality of Schottky junctions. By applying this relationship directly into the Richardson-Dushman equation photocurrents of different Transition-Metal Dichalcogenides(TMD) based devices can be estimated analytically. This model offers a simplistic approach for understanding non ideal behaviour of Schottky barrier height. Using this model we have calculated I-V characteristics of four different TMD based photodetectors under illumination as reported in literature. We have observed good agreement of our calculated results with experimental values. Mean absolute error in each of the cases was found to be not more than 6% in these calculations.
关键词： Perovskite,Voltage Dependent Schottky Barrier Height,Transition-Metal Dichalcogenide,Photodetector
更新于2025-09-16 10:30:52
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Coulomb scattering mechanism transition in 2D layered MoTe <sub/>2</sub> : effect of high- <i>κ</i> passivation and Schottky barrier height
摘要： Clean interface and low contact resistance are crucial requirements in two-dimensional (2D) materials to preserve their intrinsic carrier mobility. However, atomically thin 2D materials are sensitive to undesired Coulomb scatterers such as surface/interface adsorbates, metal-to-semiconductor Schottky barrier (SB), and ionic charges in the gate oxides, which often limits the understanding of the charge scattering mechanism in 2D electronic systems. Here, we present the effects of hafnium dioxide (HfO2) high-κ passivation and SB height on the low-frequency (LF) noise characteristics of multilayer molybdenum ditelluride (MoTe2) transistors. The passivated HfO2 passivation layer significantly suppresses the surface reaction and enhances dielectric screening effect, resulting in an excess electron n-doping, zero hysteresis, and substantial improvement in carrier mobility. After the high-κ HfO2 passivation, the obtained LF noise data appropriately demonstrates the transition of the Coulomb scattering mechanism from the SB contact to the channel, revealing the significant SB noise contribution to the 1/f noise. The substantial excess LF noise in the subthreshold regime is mainly attributed to the excess metal-to-MoTe2 SB noise and is fully eliminated at the high drain bias regime. This study provides a clear insight into the origin of electronic signal perturbation in 2D electronic systems.
关键词： Coulomb screening,low-frequency noise,Schottky barrier height,molybdenum ditelluride,high-κ passivation
更新于2025-09-10 09:29:36
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Effect of surface passivation process for AlGaN/GaN HEMT heterostructures using phenol functionalized-porphyrin based organic molecules
摘要： In this work, we investigate an unexplored possibility of passivating the charged surface states on AlGaN/GaN high electron mobility transistor (HEMT) heterostructures by using organic molecules. This has further led to remarkable enhancement in the electrical properties of rectifying metal-semiconductor contacts on AlGaN/GaN. Phenol functionalized Zinc metallated-Tetra Phenyl Porphyrin (Zn-TPPOH) organic molecules were adsorbed on AlGaN/GaN via the solution phase to form a molecular layer (MoL). The presence of the MoL was confirmed using X-ray Photoelectron Spectroscopy (XPS). The thickness of the MoL was assessed as ～1 nm, using Spectroscopic Ellipsometry and cross-sectional Transmission Electron Microscopy. XPS peak-shift analyses together with Kelvin Probe Force Microscopy revealed that the molecular surface modification reduced the surface potential of AlGaN by approximately 250 meV. Consequently, the Barrier height (ideality factor) of Ni Schottky diodes on AlGaN/GaN was increased (reduced) significantly from 0.91 ± 0.05 eV (2.5 ± 0.31) for Ni/AlGaN/GaN to 1.37 ± 0.03 eV (1.4 ± 0.29) for Ni/Zn-TPPOH/AlGaN/GaN. In addition, a noteworthy decrement in the reverse current from 2.6 ± 1.93 μA to 0.31 ± 0.19 nA at ?5 V (～10 000 times) was observed from Current-Voltage (I-V) measurements. This surface-modification process can be fruitful for improving the performance of AlGaN/GaN HEMTs, mitigating the adverse effects of polarization and surface states in these materials.
关键词： AlGaN/GaN,HEMT,Schottky barrier height,surface passivation,organic molecules,reverse current
更新于2025-09-10 09:29:36
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Statistical Analysis of the Current–Voltage ( <i>I</i> – <i>V</i> ) and Capacitance–Voltage ( <i>C</i> – <i>V</i> ) Characteristics of the Au/Ir/ <i>n</i> -InGaN Schottky Barrier Diodes
摘要： In the present work, 20 Au/Ir/n-InGaN Schottky barrier diodes (SBDs) are fabricated using a electron beam evaporation technique. The Schottky barrier parameters such as ideality factor (n), Schottky barrier height (SBH) ((cid:2)b(cid:3) and donar concentration (Nd (cid:3) values are determined by current–voltage (I–V ) and capacitance–voltage (C–V ) measurements at room temperature. From I–V measurements, the statistical distribution of data gives the mean SBH value of 0.70 eV with a normal deviation of 10 meV and mean ideality factor value of 1.50 with a normal deviation of 0.0478. Two important parameters such as series resistance (RS(cid:3) and shunt resistance (cid:3) are also evaluated from the I–V characteristics. Furthermore, Norde and Cheung’s methods are used to evaluate the SBH, ideality factor and series resistance. The statistical distribution of C–V data gives the mean SBH value of 0.91 eV with a normal deviation of 12 meV and mean donar concentration of 0.71 × 1017 cm?3 with a normal deviation of 0.018 × 1017 cm?3, respectively.
关键词： Series Resistance,Schottky Barrier Height,Ideality Factor
更新于2025-09-09 09:28:46