研究目的
Investigating the effects of Cu doping concentration on PbS thin films for solar cell fabrication using nebulizer spray pyrolysis.
研究成果
Copper (Cu2+) ions were successfully incorporated into the PbS structure which was confirmed from the XRD and further confirmation was carried out by EDAX. The band gap varies from 1.61 eV to 2.10 eV for increasing the doping level from 0% to 6%. This phenomenon can improve the conversion efficiency of the solar cell.
研究不足
The obtained low efficiency is due to the defect mechanism in the Cu:PbS structure. There is a substantial increase in band gap on increasing the Cu doping level.
1:Experimental Design and Method Selection
PbS films were fabricated on glass by simple spray method using nebulizer. The doping percentage of Cu was increased from 0% to 8% in steps of 2%. All other deposition parameters were kept constant.
2:Sample Selection and Data Sources
Lead nitrate (PbNO3) as a source for Pb and thiourea (CS(NH2)2) as a source for S were used to deposit the PbS thin films. The prepared solution was sprayed as pure and added dopant Cu precursor of concentrations 2%, 4%, 6% and 8wt.%.
3:List of Experimental Equipment and Materials
Nebulizer spray gun, Lambda Perkin Elmer UV-Vis-NIR Spectrophotometer, PAN analytical X’Pert Pro XRD, EVO 18 ZEISS scanning electron microscope, Atomic Force Microscopy (AFM), spectrofluorometer, Hall Effect measurement setup, Keithley source meter (Model-2450).
4:Experimental Procedures and Operational Workflow
The prepared solution was sprayed on the substrate surface. The nebulizer spray gun was with a programmed stepper motor system which was moved in x-y direction to attain uniform films. Later the prepared Cu:PbS films were cooled to room temperature and characterized for various studies.
5:Data Analysis Methods
The optical band gap was calculated using absorption measurement spectrum by the Tauc relation. The crystalline size (D), strain (ε) and dislocation-density (δ) of Cu:PbS thin films were determined using specific equations.
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Keithley source meter
Model-2450
Keithley
Used to measure the variation of current and voltage (I-V) for the prepared PbS solar cell.
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EVO 18 ZEISS scanning electron microscope
EVO 18
ZEISS
Used to analyze the morphology and elemental analysis of the prepared films.
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Nebulizer spray gun
Not provided
Not provided
Used for the deposition of PbS thin films on glass substrates.
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Lambda Perkin Elmer UV-Vis-NIR Spectrophotometer
Not provided
Perkin Elmer
Used for optical measurements of the thin films.
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PAN analytical X’Pert Pro XRD
X’Pert Pro
PAN analytical
Used for X-ray diffraction study of the films.
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Atomic Force Microscopy (AFM)
Not provided
Not provided
Used to visualize the films surface roughness.
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Spectrofluorometer
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Not provided
Used to obtain the photoluminescence (PL) spectrum of the sample.
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Hall Effect measurement setup
Not provided
Not provided
Used to find the type of conductivity and carrier concentration.
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