研究目的
Investigating the role of NaF post-deposition treatment on the photovoltaic characteristics of semitransparent ultrathin Cu(In,Ga)Se2 solar cells prepared on indium-tin-oxide back contacts.
研究成果
The NaF PDT significantly improved the PV parameters of ultrathin CIGSe solar cells on ITO back contacts, including Voc, Jsc, FF, and efficiency. The improvements were attributed to increased acceptor density, reduced defect density, and passivated grain boundaries. The study provides insights into the importance of Na in CIGSe absorbers and the potential of ultrathin solar cells for cost-effective PV electricity generation.
研究不足
The study is limited to ultrathin CIGSe solar cells with absorber thicknesses of <500 nm and focuses on the effects of NaF PDT. The findings may not be directly applicable to thicker absorbers or different back contact materials.
1:Experimental Design and Method Selection:
The study involved the preparation of ultrathin CIGSe solar cells on ITO back contacts with and without NaF PDT. A 1-stage co-evaporation process was used for absorber deposition.
2:Sample Selection and Data Sources:
Two types of CIGSe absorbers were grown on ITO-glass, one subjected to NaF PDT (C–Na) and the other not (C0).
3:0). List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Equipment included a co-evaporation chamber, SEM, TEM, AFM, and various measurement setups for JV, EQE, CV, DLCP, and AS analyses. Materials included ITO-coated SLG substrates, NaF, and CIGSe precursors.
4:Experimental Procedures and Operational Workflow:
The CIGSe absorbers were deposited, followed by NaF PDT for C–Na. CdS buffer, i-ZnO, and ITO layers were then deposited, and Al grids were added for current collection.
5:Data Analysis Methods:
The solar cells were analyzed using JV measurements, EQE measurements, CV measurements, DLCP, and AS to understand the improvements in PV parameters.
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Atomic force microscope
Nanoscope
Bruker
Used for surface topography analysis of the CIGSe films.
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Source meter
2440 5A
Keithley
Used for illuminated-current–voltage (JV) data collection.
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X-ray diffractometer
D/Max-2500
Rigaku
Used for structural analysis of the fabricated CIGSe thin films.
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Scanning electron microscope
S-4700
Hitachi
Used for morphological analysis of the CIGSe thin films.
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Transmission electron microscope
JEM-ARM200F
JEOL
Used for CIGSe/ITO interface analysis.
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ITO-coated SLG substrate
Taewon Science Co., Ltd
Used as a substrate for the deposition of the CIGSe absorber.
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Solar simulator
K201-LAB 50
McScience
Provides simulated solar radiation for JV measurements.
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Spectral response measurement system
S-9203 HINODE mini 5
Soma
Used for wavelength-dependent carrier collection efficiency examination.
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