研究目的
Investigating the synthesis of wafer-scale PdSe2 thin films by selenization method and their application in broadband photodetection.
研究成果
The study successfully synthesized large-area polycrystalline PdSe2 films by selenization of Pd films, demonstrating their suitability for broadband photodetection with high responsivity and detectivity. The method offers a scalable approach to produce PdSe2 films for optoelectronic applications.
研究不足
The polycrystalline structure of PdSe2 films may introduce defects that act as recombination centers for photogenerated carriers, potentially reducing the photodetector performance.
1：Experimental Design and Method Selection:
The study involved the synthesis of PdSe2 thin films by selenization of Pd films, characterization of the films, and fabrication of photodetectors to evaluate their performance.
2：Sample Selection and Data Sources:
Pd films on sapphire substrates were prepared by DC magnetron sputtering, followed by selenization to produce PdSe2 films.
3：List of Experimental Equipment and Materials:
A DC magnetron sputtering system, tube furnace for selenization, high resolution transmission electron microscopy (HRTEM), selected area electron diffraction (SAED), energy-dispersive X-ray spectroscopy (EDX), X-ray diffraction (XRD), Raman spectroscopy, atomic force microscope (AFM), UV-vis-NIR absorption spectroscopy, and Keithley 4200-SCS for electrical measurements.
4：Experimental Procedures and Operational Workflow:
Pd films were sputtered on sapphire substrates, selenized to form PdSe2 films, characterized for their structural and optical properties, and then fabricated into photodetectors to measure their photoresponse.
5：Data Analysis Methods:
The photoresponse of the PdSe2-based photodetectors was analyzed under various wavelengths of light, and the responsivity and detectivity were calculated.
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High resolution transmission electron microscopy
JEOL JEM-2100F
JEOL
Used for HRTEM, SAED, and EDX measurements of the PdSe2 films.
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X-ray Diffractometer
Rigaku SmartLab
Rigaku
Used for XRD measurements of the PdSe2 films.
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UV/Vis Spectrophotometer
Perkin Elmer LAMBDA 1050
Perkin Elmer
Used for UV-vis-NIR absorption spectroscopy of the PdSe2 films.
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Keithley 4200-SCS
4200-SCS
Keithley
Used for electrical measurements of the PdSe2 transistors.
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DC magnetron sputtering system
Used for the deposition of Pd films on sapphire substrates.
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Raman Spectrometer
LabRAM HR 800
Used for Raman spectroscopy measurements of the PdSe2 films.
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Atomic Force Microscope
Asylum MFP-3D Infinity
Asylum Research
Used for thickness measurements of the PdSe2 films.
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