研究目的
To investigate the phase composition of nanoparticles formed under SSI-PLA at the boundary of aluminum nanolayer in the glue-free joint of parts from Zerodur and to determine the layer thickness, at which transformation of aluminum layer takes place under action of focused laser radiation.
研究成果
The experimental X-ray investigations revealed that phase composition changes occur only within a 50–100 nm range around the interfacial aluminum nanolayer. Cubic silicon nanoparticles approximately 12 nm in size were identified, along with nanoparticles of aluminum cubic phase. These findings contribute to understanding the effects of laser ablation at solid-solid interfaces and the formation of nanoparticles under such conditions.
研究不足
The study focused on changes within a very narrow region (50–100 nm) around the aluminum nanolayer, potentially limiting the broader applicability of the findings. The specific conditions of laser ablation and the unique properties of Zerodur may also limit the generalizability of the results to other materials or conditions.
1：Experimental Design and Method Selection:
The study involved pulsed focused laser irradiation on plates of Zerodur connected to a solid monolith block with an aluminum nanolayer. The Zerodur plate was thinned step-by-step by grinding and polishing up to the boundary with the aluminum nanolayer after each laser ablation. X-ray phase analysis was performed after each thinning step using a diffractometer.
2：Sample Selection and Data Sources:
Samples were two Zerodur plates joined with a solid monolith by a nanolayer of aluminum with a 100-nm thickness.
3：List of Experimental Equipment and Materials:
Philips X’Pert PRO – MRD diffractometer, Cu Kal emission line (wavelength k =
4：15405980 nm), anode potential of 45 kV, and current of 40 mA. Experimental Procedures and Operational Workflow:
The X-rays were incident onto the sample surface under low angles (1–5(cid:1)), with detector 2-theta scanning by the step of
5：025(cid:
1) and data acquisition time of 5 s in each point.
6：Data Analysis Methods:
The size of silicon nanoparticles was estimated using the Scherrer formula.
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