研究目的
Investigating the effect of selenization temperature on the properties of Sb2Se3 thin films and solar cells prepared by electron-beam evaporation followed by selenization process.
研究成果
The study successfully demonstrated the preparation of high-quality Sb2Se3 thin films using e-beam evaporation followed by selenization. Optimal properties were achieved at a selenization temperature of 360 °C, leading to solar cells with a power conversion efficiency of 1.15%. The method shows promise for further development of Sb2Se3 thin-film solar cells.
研究不足
The study is limited to the effect of selenization temperature on Sb2Se3 thin films and solar cells prepared by a specific two-step method. The efficiency of the solar cells is relatively low compared to other thin-film solar cells, indicating potential areas for optimization in the selenization process and device structure.
1:Experimental Design and Method Selection:
The study employed a two-step method involving electron-beam evaporation of Sb followed by selenization at various temperatures to prepare Sb2Se3 thin films.
2:Sample Selection and Data Sources:
Soda-lime glasses (SLG) were used as substrates, cleaned and coated with Mo before Sb deposition.
3:List of Experimental Equipment and Materials:
Equipment included an e-beam evaporation system, tube furnace for selenization, X-ray diffraction (XRD), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), scanning electric microscopy (SEM), atomic force microscopy (AFM), UV–Vis–NIR spectrometer, and Hall-effect measurement instrument.
4:Experimental Procedures and Operational Workflow:
Sb metal precursor layers were deposited by e-beam evaporation, followed by selenization at temperatures ranging from 340 to 400 °C. The films were then characterized for structural, optical, and morphological properties.
5:Data Analysis Methods:
XRD and Raman spectroscopy were used for structural analysis, SEM and AFM for morphological analysis, UV–Vis–NIR for optical properties, and Hall-effect measurements for electrical properties.
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X-ray diffraction
Empyrean
PANalytical
Characterization of crystal structures
-
X-ray photoelectron spectroscopy
K-Alpha+
Thermo Scientific
Analysis of chemical valence
-
Atomic force microscopy
Naio
Nanosurf
Surface topography imaging
-
UV–Vis–NIR spectrometer
UV3600
Shimadzu
Transmittance measurement
-
Source meter
2400
Keithley
Current density–voltage characteristics measurement
-
Raman spectroscopy
inVia
Renishaw
Characterization of lattice vibrations
-
Scanning electric microscopy
LYRA3
TESCAN
Surface morphology imaging
-
Hall-effect measurement instrument
ET-9000
East Changing
Electrical properties investigation
-
Solar simulator
91192-1000 W
Oriel
Simulation of solar illumination
-
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