研究目的
Investigating the application of an ALD-derived AZO protective layer for CuNW-based bottom electrodes in flexible PSCs to improve their thermal/chemical stability and band alignment between the ETL and CuNWs.
研究成果
The ALD-derived AZO protective layer significantly improves the thermal/chemical stability and band alignment of CuNW-based electrodes in flexible PSCs, leading to enhanced PCE and mechanical stability. The g-AZO-based composite electrodes demonstrate superior performance and durability, making them promising candidates for low-cost and flexible PSCs.
研究不足
The study focuses on the improvement of PSCs using CuNW-based electrodes with AZO protective layers but does not extensively explore the long-term stability under various environmental conditions beyond mechanical bending.
1:Experimental Design and Method Selection:
The study involves the fabrication of AZO/CuNW-based composite electrodes using ALD for protective layers with varying Al dopant concentrations.
2:Sample Selection and Data Sources:
CuNWs were synthesized and coated on a PES substrate, followed by the deposition of AZO layers.
3:List of Experimental Equipment and Materials:
ALD system, SEM, UV–visible spectrophotometer, XPS, UPS, PL, TRPL, IMPS/IMVS, and IS were used.
4:Experimental Procedures and Operational Workflow:
The process includes the deposition of AZO layers, fabrication of PSCs, and characterization of their optical, structural, and electrical properties.
5:Data Analysis Methods:
The data were analyzed using various spectroscopic and electrical measurement techniques to evaluate the performance and stability of the PSCs.
独家科研数据包,助您复现前沿成果,加速创新突破
获取完整内容-
Field-Emission SEM
JSM-7800F
JEOL Ltd.
Surface and cross-sectional structure analysis
-
UV?visible spectrophotometer
V-670
Jasco
Optical transmittance and reflectance measurements
-
XPS
K-alpha
Thermo Fisher Scientific Inc.
Elemental depth profiling
-
UPS
AXIS NOVA
Kratos
Energy level determination
-
TRPL
MicroTime-200
Picoquant
Time-resolved photoluminescence measurements
-
Atomic Layer Deposition System
NCD Inc.
Deposition of AZO protective layers on CuNWs
-
PL
MAPLE-II
Dongwoo Optron
Steady-state photoluminescence measurements
-
IMPS/IMVS
Zennium
Zahner
Intensity-modulated photocurrent/photovoltage spectroscopy
-
IS
1287A
Solartron
Impedance spectroscopy
-
登录查看剩余7件设备及参数对照表
查看全部