研究目的
Investigating the effect of variation of surface density of nanocrystals on the photoresponse characteristics of ZnO polymer nanocomposite.
研究成果
The ZnO-cellulose nanocomposites synthesized at a precursor concentration of 50 mM exhibited the highest UV response and sensitivity, making them suitable for the fabrication of high sensitivity UV sensors. The study demonstrates the potential of these nanocomposites for inexpensive ultraviolet sensor applications.
研究不足
The study focuses on the effect of precursor concentration on the nanocomposite's properties but does not explore the effect of the nature of the substrate. The band gap narrowing mechanism is not fully understood.
1:Experimental Design and Method Selection:
The study employed a low-cost solution casting method to grow ZnO nanocrystals on cellulose. The precursor concentration was varied to study its effect on the nanocomposite's properties.
2:Sample Selection and Data Sources:
Cellulose fibers and zinc precursors were used to synthesize ZnO-cellulose nanocomposites. The samples were characterized using FESEM, EDX, BET, XRD, and DRS.
3:List of Experimental Equipment and Materials:
FESEM (Supra 55, Carl Zeiss), energy-dispersive X-ray spectroscopy (Oxford Instruments), BET surface area analyzer (Micromeritics 3FLEX 3500), X-ray diffractometer (D-8, Bruker), UV–Vis spectrophotometer (Agilent Cary 5000), source meter unit (Keithley 2450), CHI660C Electrochemical Workstation (CH Instruments).
4:Experimental Procedures and Operational Workflow:
The synthesis involved preparing solutions, heating, cooling, and dispersing cellulose fibers in the solution mixture. The nanocomposites were then characterized for morphology, composition, and photoresponse properties.
5:Data Analysis Methods:
The data were analyzed using Kubelka–Munk theory for band gap estimation and Tauc’s equation for direct allowed transitions.
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FESEM
Supra 55
Carl Zeiss
Morphology and size analysis of nanocrystals
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X-ray diffractometer
D-8
Bruker
Crystal structure analysis
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UV–Vis spectrophotometer
Cary 5000
Agilent
Diffused reflectance spectroscopy analysis
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Source meter unit
2450
Keithley
Current–voltage characteristics measurement
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Electrochemical Workstation
CHI660C
CH Instruments
Time-resolved photocurrent measurement
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Energy-dispersive X-ray spectroscopy
Oxford Instruments
Elemental composition analysis
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BET surface area analyzer
3FLEX 3500
Micromeritics
Surface area measurement
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