研究目的
Exploring novel piezoelectric materials that can stand ultrahigh temperature for high-temperature piezoelectric vibration sensor applications.
研究成果
The NBN ceramic prepared by sol–gel method and pressureless sintering technique exhibits high Curie temperature, stable piezoelectric properties, and high thermal-depoling temperature, making it a promising material for high-temperature piezoelectric applications.
研究不足
The study focuses on the preparation and characterization of NBN ceramics but does not extensively explore the optimization of piezoelectric properties or the scalability of the sol–gel method for industrial applications.
1:Experimental Design and Method Selection:
The NBN nano-powders were prepared by a novel sol–gel method, involving the transformation of Nb2O5 into a water-soluble species and the use of ethanolamine to prevent the hydrolysis of Bi3+ ion.
2:Sample Selection and Data Sources:
Raw materials included Nb2O5, KOH, Na2CO3, Bi(NO3)3·5H2O, acetic acid, oxalic acid, citric acid, nitric acid, ammonia, and ethylene glycol.
3:List of Experimental Equipment and Materials:
X-ray diffraction (XRD, Bruker D8 Advance), transmission electron microscope (TEM, FEI Tecnai F20), scanning electron microscopy (SEM, Hitachi S4800), multi-frequency inductance capacitance resistance (LCR) analyzer (Agilent E4980A), ferroelectric tester (Premier II, Radiant Technologies Inc.), piezoelectric d33 metre (ZJ-6A).
4:Experimental Procedures and Operational Workflow:
The sol was heated to prepare dried gels, which were then calcined at various temperatures to obtain NBN nano-powders. These powders were pressed into pellets and sintered to obtain dense ceramics.
5:Data Analysis Methods:
The crystal structures were examined by XRD, morphology by TEM and SEM, dielectric properties by LCR analyzer, ferroelectric properties by ferroelectric tester, and piezoelectric properties by d33 metre.
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X-ray diffraction
D8 Advance
Bruker
Examining the crystal structures of the samples
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Transmission electron microscope
Tecnai F20
FEI
Analyzing the morphology of the nano-powders
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Scanning electron microscopy
S4800
Hitachi
Observing the microstructure of the ceramics
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Multi-frequency inductance capacitance resistance analyzer
E4980A
Agilent
Measuring the dielectric property and its dependence on temperature
E4980A/E4980AL Precision LCR Meter
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Ferroelectric tester
Premier II
Radiant Technologies Inc.
Measuring the polarisation–electric field (P–E) loops
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Piezoelectric d33 metre
ZJ-6A
Institute of Acoustics, Academic Sinica
Measuring the piezoelectric constant d33
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