研究目的
Investigating the physical principles of photoelectron diffraction and its applications in providing local structural information not dependent on long-range periodicity.
研究成果
Photoelectron diffraction is an established technique in surface crystallography, providing detailed quantitative local structural information for adsorbates and information on the growth habit and crystallography of ultra-thin epitaxial films. The availability of improved sources of intense soft X-rays at high spectral resolution is leading to further exploitation of chemical-shift photoelectron diffraction.
研究不足
The trial-and-error methodology is inherently inefficient and there is a possibility that the true structure will not be found because the appropriate structural model was never tested. Direct methods of inverting the experimental data to provide a structural solution are ineffective due to the role of the scattering phase shifts and the influence of multiple scattering.
1：Experimental Design and Method Selection:
The article describes the use of photoelectron diffraction as a local scattering technique for surface structural information, highlighting two distinct versions of the technique: scanned-energy mode photoelectron diffraction (PhD) and scanned-angle mode (XPD).
2：Sample Selection and Data Sources:
The method is applied to studies of adsorbed species on surfaces and the study of the earliest stages of epitaxial growth.
3：List of Experimental Equipment and Materials:
Synchrotron radiation facilities and monochromators are used for the scanned-energy mode, while conventional XPS instruments based on Al or Mg Ka radiation are used for the angle-scan experiments at high photoelectron energies.
4：Experimental Procedures and Operational Workflow:
The article details the process of photoemitting electrons from a core level of a near-surface atom of a solid and the interference of the outgoing photoelectron wavefield with components elastically scattered by surrounding atoms.
5：Data Analysis Methods:
The analysis involves computational simulations for trial model structures, with some inclusion of the role of multiple scattering, and the use of an objective reliability- or R-factor to quantify the level of agreement.
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