研究目的
Investigating the effects of withdrawal speeds on the properties of ZnO thin films prepared by sol-gel immerse technique, including crystal growth, orientation, crystallinity, and optical performance.
研究成果
ZnO thin films exhibit polycrystalline hexagonal wurtzite structure with high crystallinity and transmittance over 80% in visible-near IR region. Increasing withdrawal speeds lead to larger grain sizes, changes in crystal orientation from stratified to island structure, and decreased transmittance in the visible region. The research provides insights for optimizing sol-gel processes for photoelectric applications.
研究不足
The study is limited to specific withdrawal speeds and sol-gel parameters; other factors like precursor concentration or annealing conditions may also affect film properties and were not varied. Application constraints include potential cracking of films at higher speeds and non-homogeneous surfaces.
1：Experimental Design and Method Selection:
The study uses sol-gel immerse technique to prepare ZnO thin films on glass substrates, with varying withdrawal speeds (500, 1000, 1500, 2000 μm/s) to investigate their effects. Methods include XRD for crystal structure, SEM for morphology, and UV-Vis spectrophotometry for optical properties.
2：Sample Selection and Data Sources:
Glass sheets are used as substrates, cleaned with hydrochloric acid, detergent, deionized water, acetone, and ethanol. ZnO sol is prepared from zinc acetate dihydrate, monoethanolamine, and 2-methoxyethanol.
3：List of Experimental Equipment and Materials:
Equipment includes magnetic stirrer, drying oven, rapid annealing furnace, D8 ADVANCE X-ray diffractometer, SIGMA FE-SEM, and UV-6 spectrophotometer. Materials include zinc acetate dihydrate, monoethanolamine, 2-methoxyethanol, hydrochloric acid, detergent, deionized water, acetone, anhydrous ethanol.
4：Experimental Procedures and Operational Workflow:
Substrates are immersed in ZnO sol at specified withdrawal speeds for 60 s, dried at 250°C for 10 min, repeated five times, then annealed at 500°C for 60 min. Characterization is done using XRD, SEM, and UV-Vis.
5：Data Analysis Methods:
XRD data analyzed using Debye Scherrer formula for grain size, SEM for morphology, UV-Vis for transmittance and optical band gap calculation.
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