研究目的

To provide a perspective on TEM-based studies of halide perovskites (HPs), discuss their applications, challenges, and future opportunities in understanding HP materials and devices for solar cells and optoelectronics.

研究成果

TEM-based techniques are powerful for characterizing HPs at multiple length scales, providing insights into atomic structures, nano/micro-structures, and device interfaces. However, beam damage poses challenges that need to be addressed. Future research should focus on minimizing damage, conducting in situ studies, and applying TEM to solve key problems in HP science, such as understanding crystallization, degradation, and ion migration, to advance the development of efficient and stable HP-based devices.

研究不足

Beam damage is a significant limitation for TEM characterization of HPs, leading to structural and compositional changes. Techniques to minimize damage (e.g., low-dose methods) are not always fully effective, and in situ experiments may introduce artifacts. Sample preparation methods like FIB can also cause degradation. The sensitivity of HPs requires careful optimization of experimental conditions, and many studies lack comprehensive beam damage assessment.