研究目的
Investigating the fabrication and performance of high-performance nitrogen doped graphene quantum dots (GQDs)/all-inorganic (CsPbBr3) perovskite nanocrystals (NCs) heterostructure photodetector.
研究成果
The hybrid GQDs/CsPbBr3 NCs photodetector showed higher performance than the single layer perovskite photodetector, with improved on/off ratio and photoresponsivity. The performance enhancement was attributed to efficient carrier separation at the interface.
研究不足
The response time of the hybrid structure was affected due to the GQDs passivation layer.
1:Experimental Design and Method Selection:
The study employed a low-cost spin coating technique followed by hot plate annealing to fabricate the photodetector.
2:Sample Selection and Data Sources:
The samples included nitrogen doped GQDs and all-inorganic CsPbBr3 perovskite NCs.
3:List of Experimental Equipment and Materials:
Equipment included a spin coater, hot plate, and characterization tools like TEM, SEM, XRD, PL spectrometer, UV–vis spectrophotometer, and semiconductor characterization system.
4:Experimental Procedures and Operational Workflow:
The GQDs and CsPbBr3 NCs were synthesized and then spin-coated onto a quartz substrate to form the heterostructure.
5:Data Analysis Methods:
The performance of the photodetector was analyzed using photoresponsivity, on/off ratio, and specific detectivity measurements.
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time-resolved PL measurement system
FLS980
Edinburgh Instruments
Measurement of time-resolved PL spectra
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oscilloscope
DPO2012B
Tektronix
Measurement of electrical signals
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optical chopper
SR540
SRS
Modulation of light source
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quartz substrate
SK-1300 series
OHAIR Quartz Co., Ltd. Korea
Substrate for device fabrication
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graphite nanoparticles
SkySpring Nanomaterials, Inc.
Material for GQDs synthesis
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transmission electron microscope
JEM-F200
Analysis of crystal structure and morphology
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field emission scanning electron microscope
JEOL-7800F
Analysis of crystal structure and morphology
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X-ray diffractometer
Ultima IV
Analysis of crystal structure
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fluorescence spectrophotometer
OPTIZEN 3220UV
Measurement of PL spectra
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Raman spectrometer
HORIBA Jobin Yvon-LabRam Aramis
Measurement of PL spectra
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UV–vis spectrophotometer
JASCO V-650
Measurement of UV–vis spectra
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semiconductor characterization system
Keithley 4200-SCS
Electrical and optoelectrical measurements
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laser diode
Light source for photoelectrical measurements
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digital SourceMeter
Keithley 2400
Measurement of electrical signals
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