研究目的
To study the structural, electrical, and optical properties of fluorinated graphene (FG) for use as functional and dielectric materials in flexible and printed electronics.
研究成果
Fluorinated graphene films exhibit excellent mechanical, electrical, and optical properties, making them highly promising for applications in flexible and printed electronics, with stability under bending strains up to 2.5-4%.
研究不足
The fluorination degree does not exceed 40-50%, and some de-fluorination occurs in water over time. The study is limited to specific fluorination methods and may not generalize to other approaches.
1：Experimental Design and Method Selection:
The study involved preparing fluorinated graphene suspensions from graphene via electrochemical exfoliation or liquid exfoliation, followed by fluorination in hydrofluoric acid solutions. Methods included AFM, SEM, HRTEM, Raman spectroscopy, XPS, electrical measurements, and optical transmission spectroscopy to characterize the properties.
2：Sample Selection and Data Sources:
Graphene suspensions were derived from high-oriented pyrolytic graphite (HOPG) or natural graphite, with flakes separated by size using filtration. Fluorination times varied to achieve different degrees.
3：List of Experimental Equipment and Materials:
Equipment included Dimatix FUJIFILM DMP-2831 printer, Solver PRO NT-MDT AFM, JEOL JSM-7800F SEM, JEOL-4000EX HRTEM, K-Alpha XPS spectrometer, SF-56 spectrometer, Bruker IFS-113V FTIR spectrometer, E4980AL LCR meter, Keithley 6485 picoamperemeter. Materials included HOPG, hydrofluoric acid, PET, polyimide, paper substrates, Ag particles.
4：Experimental Procedures and Operational Workflow:
Graphene suspensions were fluorinated, applied to substrates via drops or 2D printing, and characterized using the listed techniques. Bending tests were performed on flexible substrates.
5：Data Analysis Methods:
Data were analyzed using software like DIGITAL MICROGRAPH for HRTEM, and statistical methods for electrical and optical measurements.
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JEOL JSM-7800F scanning electron microscope
JSM-7800F
JEOL
Used for scanning electron microscopy (SEM) to obtain high-resolution images of films.
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JEOL-4000EX high-resolution transmission electron microscope
JEOL-4000EX
JEOL
Used for high-resolution transmission electron microscopy (HRTEM) to study film structure features.
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K-Alpha XPS spectrometer
K-Alpha
Thermo Scientific
Used for X-ray photoelectron spectroscopy (XPS) to study chemical composition of films.
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Bruker IFS-113V Fourier transform spectrometer
IFS-113V
Bruker
Used to record transmission spectra in the far-IR range.
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Keithley 6485 picoamperemeter
6485
Keithley
Used for current-voltage (I-V) measurements.
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Dimatix FUJIFILM DMP-2831 printer
DMP-2831
Dimatix FUJIFILM
Used for 2D printing of fluorinated graphene films and structures on substrates.
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Solver PRO NT-MDT scanning microscope
Solver PRO
NT-MDT
Used for atomic force microscopy (AFM) to image flakes and measure film thicknesses.
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SF-56 spectrometer
SF-56
Used to record transmission spectra in the visible and near-IR range.
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E4980AL LCR meter
E4980AL
Used for capacitance-voltage (C-V) measurements.
E4980A/E4980AL Precision LCR Meter
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JANDEL four-probe equipment
HM21 Test Unit
JANDEL
Used to measure sheet resistance of films.
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